Richard Perdriau

Associate Professor (Enseignant-chercheur HDR)

Richard Perdriau
E-mail richard.perdriau@eseo.fr
Office location Room C203
Address ESEO
10, bd Jeanneteau
CS 90717
49107 ANGERS Cedex 02
FRANCE
Phone +33 2 41 86 67 03

Education

  • Qualification aux fonctions de Professeur des Universités 63ème section (Accreditation as a Full Professor), 2013
  • Habilitation à Diriger des Recherches (Accreditation to Supervise Research), University of Rennes 1, 2012
    • Title: “Measurement and Modeling of Electromagnetic Immunity in Integrated Circuits”
  • PhD in Applied Sciences, Catholic University of Louvain (UCL – Louvain-la-Neuve, Belgium), 2004
    • Title: “Méthodologie de prédiction des niveaux d’émission conduite dans les circuits intégrés, à l’aide de VHDL-AMS” (A VHDL-AMS based Prediction Methodology of Conducted Emission in Integrated Circuits)
    • Advisors: Anne-Marie Trullemans-Anckaert (UCL) and Mohamed Ramdani
    • Dissertation (in French) available online
  • Engineering degree in Electronics and Computer Science, ESEO, 1992

Research

  • Member of the ESEO-EMC Research Group
    • EMC in integrated circuits
    • Mixed-signal modeling, VHDL-AMS modeling
    • Integrated circuit design
      • FPGA
      • Mixed-signal ASIC
  • Senior Member of the IEEE
    • Reviewer for IEEE Transactions on Electromagnetic Compatibility, IEEE Transactions on Instrumentation and Measurement
    • Member of the IEEE EMC, CPMT and CAS Societies
  • Member of the EMC Compo Scientific Committee
  • Additional skills: embedded electronics, embedded TCP/IP, UNIX

Teaching

  • Deputy director of the Embedded Electronics (EE) major
  • Junior projects in microelectronics
    • Analog IC design (Engineering 2nd Year, EE major)
    • Mixed-signal ASIC design flow (Engineering 3rd Year, EE major)
  • Junior projects in embedded electronics
    • Embedded Web server (Engineering 2nd Year, EE major)
    • USB-compliant portable data acquisition system (Engineering 3rd Year, EE major)
  • Practical work in clean room (CCMO – Rennes) (Engineering 2ndYear, EE major)
  • Advanced VHDL synthesis – practical work (Engineering 2nd Year, EE major)
  • VHDL-AMS modeling – practical work (Engineering 3rd Year, EE major)
  • SystemC language – practical work (Engineering 3rd Year, EE major)
  • Embedded C language (Engineering 2nd Year, EE major)
  • Integrated electronic functions (Engineering 1st Year)
  • Introduction to microelectronics – practical work (Engineering 1st Year)
  • Problem-based learning in telecommunication (Engineering 1st Year)
  • System administration of IC CAD software

Personal interests

  • Piloting
    • Private pilot (PPL-A) since 1997, Aéro-club Angers-Marcé
    • FCL 1.028 (English VFR – level 6)
    • CAEA (Certificat d’Aptitude à l’Enseignement Aéronautique – giving permission to teach aeronautics in high schools)
    • Teaching BIA (Brevet d’Initiation Aéronautique – Initial Degree in Aeronautics) courses, in “Seconde” class (~ 5th form), Lycée Privé Mongazon (Angers)
    • PPL-A ground instructor, Aéro-club Angers-Marcé
  • Music
    • Piano and synthesizers
    • Arranging and orchestration
    • Audio recording, mixing and mastering
  • Traveling

Publications (HAL)

Journal articles

  1. Sjoerd Op 'T Land, Mohamed Ramdani, Richard Perdriau Dominant Coupling Mechanism for Integrated Circuit Immunity of SOIC Packages Up To 10 GHz IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2018, 60 (4), pp.965-970. 〈10.1109/TEMC.2017.2756915〉
    @article{land:hal-01698776,
      TITLE = {{Dominant Coupling Mechanism for Integrated Circuit Immunity of SOIC Packages Up To 10 GHz}},
      AUTHOR = {Land, Sjoerd Op 't and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01698776},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {60},
      NUMBER = {4},
      PAGES = {965-970},
      YEAR = {2018},
      DOI = {10.1109/TEMC.2017.2756915},
      KEYWORDS = {ICIM-CI ; ICIM-RI ; GDPI ; EMC ; immunity ; integrated circuit ; modeling ; GTEM ; ROME},
      PDF = {https://hal.archives-ouvertes.fr/hal-01698776/file/Op%20%27t%20Land%20-%20Dominant%20Coupling%20Mechanism%20for%20Integrated%20Circuit%20Immunity%20of%20SOIC%20Packages%20Up%20To%2010%20GHz%200.pdf},
      HAL_ID = {hal-01698776},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    As the frequency of functional signals and interfering fields is rising beyond 1 GHz, the immunity of integrated circuits (ICs) against these higher frequencies is interesting. To design test setups that mimic the real-world interference an IC may receive, the dominant coupling mechanism (radiation or conduction) needs to be known. We hypothesize that the dominant coupling mechanism is conduction for SOIC packages up to about 10 GHz. To challenge this hypothesis, the radiated immunity of a Printed Circuit Board (PCB) trace connected to a voltage regulator IC is predicted and measured. The radiated immunity is predicted to be the product of the field-to-trace attenuation and the conducted immunity of the IC, thus neglecting the radiated immunity of the IC. As far as could be measured, the prediction correlated well with measurement, so the dominant-conduction hypothesis was not falsified with this case study.
  2. Sjoerd Op 'T Land, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi, Frank Leferink Field-To-Long-Segmented-Trace Coupling with Arbitrary Loads and a Transparent Upper Bound Using a Single Modified Taylor Cell IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2016, 58 (5), pp.1517-1525. 〈10.1109/TEMC.2016.2566449〉
    @article{optland:hal-01377005,
      TITLE = {{Field-To-Long-Segmented-Trace Coupling with Arbitrary Loads and a Transparent Upper Bound Using a Single Modified Taylor Cell}},
      AUTHOR = {Op 't Land, Sjoerd and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed and Leferink, Frank},
      URL = {https://hal.archives-ouvertes.fr/hal-01377005},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {58},
      NUMBER = {5},
      PAGES = {1517-1525},
      YEAR = {2016},
      DOI = {10.1109/TEMC.2016.2566449},
      KEYWORDS = {GTEM cell ; field-to-trace coupling ; modified Taylor model ; closed-form solution ; full-wave simulation},
      PDF = {https://hal.archives-ouvertes.fr/hal-01377005/file/OptLand-GeneralizedTaylor-local.pdf},
      HAL_ID = {hal-01377005},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    In modern electronic products, the printed circuit board (PCB) traces may well form the dominant coupling path in radiated immunity problems. Therefore, an understanding of the designable parameters that influence the worst-case induced voltages can be of use to the PCB designer, together with rapid simulations. Therefore, a modified single (unmeshed) Taylor cell is combined with transmission line theory to predict the terminal voltages induced by a grazing, vertically polarized plane wave, incident on a multi-segment trace with arbitrary terminal impedances. The resulting model is closed-form and therefore suitable for rapid simulations. Furthermore, the model is geometrically approximated to provide understanding on how designable PCB parameters determine the worst-case induced voltage. Finally, the model is compared to measurement results.
  3. Mohamed Amellal, Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Ali Ahaitouf, M'Hamed Drissi Design of a Wideband Multiplexer for Direct Power Injection on Non-DC Functional Signals IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2015, pp.603 - 606. 〈10.1109/TEMC.2015.2405089〉
    @article{amellal:hal-01161603,
      TITLE = {{Design of a Wideband Multiplexer for Direct Power Injection on Non-DC Functional Signals}},
      AUTHOR = {Amellal, Mohamed and Op 't Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Ahaitouf, Ali and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-01161603},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      PAGES = {603 - 606},
      YEAR = {2015},
      MONTH = Jun,
      DOI = {10.1109/TEMC.2015.2405089},
      HAL_ID = {hal-01161603},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  4. Sjoerd Op 'T Land, Mohamed Ramdani, Richard Perdriau, Yannis Braux, M'Hamed Drissi Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (4), pp.864-870. 〈10.1109/TEMC.2014.2313231〉
    @article{optland:hal-01087147,
      TITLE = {{Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling}},
      AUTHOR = {Op 't Land, Sjoerd and Ramdani, Mohamed and Perdriau, Richard and Braux, Yannis and Drissi, M'Hamed},
      URL = {https://hal.inria.fr/hal-01087147},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {56},
      NUMBER = {4},
      PAGES = {864-870},
      YEAR = {2014},
      MONTH = Jun,
      DOI = {10.1109/TEMC.2014.2313231},
      KEYWORDS = {closed-form solution ; full-wave simulation ; GTEM cell ; field-to-trace coupling ; modified Taylor model},
      PDF = {https://hal.inria.fr/hal-01087147/file/OptLand-Meandered_trace_validation-vertical_corrections.pdf},
      HAL_ID = {hal-01087147},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    Predicting the immunity of electronic boards to radiated electromagnetic interference requires the computation of the coupling efficiency of an electromagnetic field to PCB traces. In the case of complex PCBs, full-wave electromagnetic solvers are convenient, yet at the expense of simulation time. Therefore, this paper introduces the extension of a modified Taylor-based analytical model to the case of traces terminated at one end by a non-characteristic impedance. This model makes it possible to determine the far-field-to-trace coupling using only a sum of closed-form equations. When applied to a shorted, meandered PCB trace, it was found to be as precise as 2.2 dB average absolute error with respect to GTEM measurements, which demonstrates its relevance for immunity prediction. Moreover, the full-wave simulation of this case study was validated using the extended model and found to be as precise as 1.4 dB average absolute error.
  5. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Marco Leone, M'Hamed Drissi Simple, Taylor-based Worst-case Model for Field-to-line Coupling Progress In Electromagnetics Research, EMW Publishing, 2013, 140, pp.297-311. 〈10.2528/PIER13041207〉
    @article{optland:hal-00832250,
      TITLE = {{Simple, Taylor-based Worst-case Model for Field-to-line Coupling}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Leone, Marco and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00832250},
      JOURNAL = {{Progress In Electromagnetics Research}},
      PUBLISHER = {{EMW Publishing}},
      VOLUME = {140},
      PAGES = {297-311},
      YEAR = {2013},
      MONTH = Jun,
      DOI = {10.2528/PIER13041207},
      KEYWORDS = {field-to-line coupling ; Taylor ; analytical model ; worst case ; microstrip ; PCB ; long line},
      PDF = {https://hal.archives-ouvertes.fr/hal-00832250/file/Op_t_Land_-_Simple_Taylor-based_worst-case_model_for_field-to-line_coupling.pdf},
      HAL_ID = {hal-00832250},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    To obtain Electromagnetic Compatibility (EMC), we would like to study the worst-case electromagnetic field-induced voltages at the ends of Printed Circuit Board (PCB) traces. With increasing frequencies, modelling these traces as electrically short no longer suffices. Accurate long line models exist, but are too complicated to easily induce the worst case. Therefore, we need a simple analytical model. In this article, we predict the terminal voltages of an electrically long, two-wire transmission line with characteristic loads in vacuum, excited by a linearly polarised plane wave. The model consists of a short line model (one Taylor cell) with an intuitive correction factor for long line effects: the modified Taylor cell. We then adapt the model to the case of a PCB trace above a ground plane, illuminated by a grazing, vertically polarised wave. For this case, we prove that end-fire illumination constitutes the worst case. We derive the worst-case envelope and try to falsify it by measurement in a Gigahertz Transverse Electromagnetic (GTEM) cell.
  6. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani Low-cost 0603 SMD Impedance Measurement Fixture Revue Méditerranéenne des Télécommunications, 2013, 3 (1), pp.81-84
    @article{optland:hal-00776510,
      TITLE = {{Low-cost 0603 SMD Impedance Measurement Fixture}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00776510},
      JOURNAL = {{Revue M{\'e}diterran{\'e}enne des T{\'e}l{\'e}communications}},
      VOLUME = {3},
      NUMBER = {1},
      PAGES = {81-84},
      YEAR = {2013},
      MONTH = Apr,
      PDF = {https://hal.archives-ouvertes.fr/hal-00776510/file/OptLand_SMD_fixture-local.pdf},
      HAL_ID = {hal-00776510},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    For microwave designs and when designing for electromagnetic compatibility (EMC), we need competent models of passive surface mount devices (SMDs), that is: resistors, capacitors and inductors. Such models are not always available or trustworthy, so we sometimes need to measure the impedance of these components ourselves. Appropriate measurement equipment exists, but often exceeds the available budget. In this paper, we design and build a low-cost test fixture that allows to measure the impedance of a 0603 SMD with a vector network analyser (VNA) or impedance analyser. Different fixture compensation methods are compared; a Short-Open-Load (SOL) calibration seems to be reliable up to about 12 GHz. The impedance precision depends on the used analyser.
  7. Shih-Yi Yuan, Yu-Lun Wu, Richard Perdriau, Shry-Sann Liao Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (2), pp.299-306. 〈10.1109/TEMC.2012.2218285〉
    @article{yuan:hal-00957944,
      TITLE = {{Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop}},
      AUTHOR = {Yuan, Shih-Yi and Wu, Yu-Lun and Perdriau, Richard and Liao, Shry-Sann},
      URL = {https://hal.archives-ouvertes.fr/hal-00957944},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {55},
      NUMBER = {2},
      PAGES = {299-306},
      YEAR = {2013},
      MONTH = Apr,
      DOI = {10.1109/TEMC.2012.2218285},
      KEYWORDS = {Electromagnetic compatibility (EMC) ; electromagnetic radiation ; near fields ; phase-locked loops},
      HAL_ID = {hal-00957944},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper presents a combined hardware-software mechanism for the detection of electromagnetic interference of a microcontroller (mu C) in daily usage. This detection mechanism is based on the instability of phase-lock loop embedded in the target mu C. It can detect the presence of EMI with higher sensitivity than polling the hardware status of the mu C internal registers and thus provides a better detection margin within the 10 kHz to 1 GHz EMI frequency range. Despite its relative slowness and its resource consumption, it is very robust, can be implemented in virtually any application software, and does not require any electromagnetic compatibility test equipment.
  8. M. Chaoui, Richard Perdriau, H. Ghariani, M. Lahiani Design of a Class-E Transcutaneous Energy Transmitter for an Implantable System Microelectronics International, Emerald, 2012, 9 (1), pp.22-34
    @article{chaoui:hal-01158600,
      TITLE = {{Design of a Class-E Transcutaneous Energy Transmitter for an Implantable System}},
      AUTHOR = {Chaoui, M. and Perdriau, Richard and Ghariani, H. and Lahiani, M.},
      URL = {https://hal.archives-ouvertes.fr/hal-01158600},
      JOURNAL = {{Microelectronics International}},
      PUBLISHER = {{Emerald}},
      VOLUME = {9},
      NUMBER = {1},
      PAGES = {22-34},
      YEAR = {2012},
      HAL_ID = {hal-01158600},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  9. M. Chaoui, Richard Perdriau, Ghariani Hamadi, M. Lahiani Electrical modeling of the sensitivity to misalignments of a class-E based inductive transcutaneous link Microelectronics Journal, Elsevier, 2012, 43 (11), pp.721-729. 〈10.1016/j.mejo.2012.07.013〉
    @article{chaoui:hal-01161600,
      TITLE = {{Electrical modeling of the sensitivity to misalignments of a class-E based inductive transcutaneous link}},
      AUTHOR = {Chaoui, M. and Perdriau, Richard and Hamadi, Ghariani and Lahiani, M.},
      URL = {https://hal.archives-ouvertes.fr/hal-01161600},
      JOURNAL = {{Microelectronics Journal}},
      PUBLISHER = {{Elsevier}},
      VOLUME = {43},
      NUMBER = {11},
      PAGES = {721-729},
      YEAR = {2012},
      MONTH = Jul,
      DOI = {10.1016/j.mejo.2012.07.013},
      HAL_ID = {hal-01161600},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  10. Richard Perdriau, Olivier Maurice, Stéphane Dubois, Mohamed Ramdani, Etienne Sicard Exploration of the Radiated Immunity of Integrated Circuits up to 40 GHz Electronics Letters, IET, 2011, 47 (10), pp.589-590
    @article{perdriau:hal-01187191,
      TITLE = {{Exploration of the Radiated Immunity of Integrated Circuits up to 40 GHz}},
      AUTHOR = {Perdriau, Richard and Maurice, Olivier and Dubois, St{\'e}phane and Ramdani, Mohamed and Sicard, Etienne},
      URL = {https://hal.archives-ouvertes.fr/hal-01187191},
      JOURNAL = {{Electronics Letters}},
      PUBLISHER = {{IET}},
      VOLUME = {47},
      NUMBER = {10},
      PAGES = {589-590},
      YEAR = {2011},
      MONTH = May,
      HAL_ID = {hal-01187191},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  11. M.S. Karoui, H. Ghariani, M. Samet, Mohamed Ramdani, Richard Perdriau Bandwidth Enhancement of the Square / Rectangular Patch Antenna for Biotelemetry Applications International Journal of Information Systems and Telecommunication Engineering (IJISTE), 2010, 1-2010 (1), pp.12-18
    @article{karoui:hal-01158676,
      TITLE = {{Bandwidth Enhancement of the Square / Rectangular Patch Antenna for Biotelemetry Applications}},
      AUTHOR = {Karoui, M.S. and Ghariani, H. and Samet, M. and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01158676},
      JOURNAL = {{International Journal of Information Systems and Telecommunication Engineering (IJISTE)}},
      VOLUME = {1-2010},
      NUMBER = {1},
      PAGES = {12-18},
      YEAR = {2010},
      HAL_ID = {hal-01158676},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  12. M. Chaoui, Richard Perdriau, H. Ghariani, M. Lahiani Energy Transmission via an Inductive Link in an Implantable System through Macromodel International Review on Modelling and Simulations (IREMOS), 2010, 3 (6), pp.1249-1255
    @article{chaoui:hal-01158678,
      TITLE = {{Energy Transmission via an Inductive Link in an Implantable System through Macromodel}},
      AUTHOR = {Chaoui, M. and Perdriau, Richard and Ghariani, H. and Lahiani, M.},
      URL = {https://hal.archives-ouvertes.fr/hal-01158678},
      JOURNAL = {{International Review on Modelling and Simulations (IREMOS)}},
      VOLUME = {3},
      NUMBER = {6},
      PAGES = {1249-1255},
      YEAR = {2010},
      HAL_ID = {hal-01158678},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  13. Frédéric Lafon, François De Daran, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi Immunity Modeling of Integrated Circuits: an Industrial Case IEICE Transactions on Communications, Institute of Electronics, Information and Communication Engineers, 2010, E93-B (7), pp.1723-1730. 〈10.1587/transcom.E93.B.1723〉
    @article{lafon:hal-00506607,
      TITLE = {{Immunity Modeling of Integrated Circuits: an Industrial Case}},
      AUTHOR = {Lafon, Fr{\'e}d{\'e}ric and De Daran, Fran{\c c}ois and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00506607},
      NOTE = {WOS},
      JOURNAL = {{IEICE Transactions on Communications}},
      PUBLISHER = {{Institute of Electronics, Information and Communication Engineers}},
      VOLUME = {E93-B},
      NUMBER = {7},
      PAGES = {1723-1730},
      YEAR = {2010},
      MONTH = Jul,
      DOI = {10.1587/transcom.E93.B.1723},
      HAL_ID = {hal-00506607},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper introduces a new technique for electromagnetic immunity modeling of integrated circuits (ICs), compliant with industrial requirements and valid up to 3 GHz. A specific modeling flow is introduced, which makes it possible to predict the conducted immunity of an IC according to a given criterion, whatever its external environment. This methodology was validated through measurements performed on several devices.
  14. Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohamed Ramdani, Etienne Sicard, M'Hamed Drissi Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits Microelectronics Journal, Elsevier, 2008, 39 (12), pp.1728-1735. 〈10.1016/j.mejo.2008.02.022〉
    @article{alaeldine:hal-00537773,
      TITLE = {{Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits}},
      AUTHOR = {Alaeldine, Ali and Lacrampe, Nicolas and Boyer, Alexandre and Perdriau, Richard and Caignet, Fabrice and Ramdani, Mohamed and Sicard, Etienne and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00537773},
      JOURNAL = {{Microelectronics Journal}},
      PUBLISHER = {{Elsevier}},
      VOLUME = {39},
      NUMBER = {12},
      PAGES = {1728-1735},
      YEAR = {2008},
      MONTH = Dec,
      DOI = {10.1016/j.mejo.2008.02.022},
      HAL_ID = {hal-00537773},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  15. Yannick Poire, M. Meyer, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi Design approach for filters in power supplies Electronics Letters, IET, 2008, 44 (3), pp.235. 〈10.1049/el:20083228〉
    @article{poire:hal-00537834,
      TITLE = {{Design approach for filters in power supplies}},
      AUTHOR = {Poire, Yannick and Meyer, M. and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00537834},
      JOURNAL = {{Electronics Letters}},
      PUBLISHER = {{IET}},
      VOLUME = {44},
      NUMBER = {3},
      PAGES = {235},
      YEAR = {2008},
      MONTH = Jan,
      DOI = {10.1049/el:20083228},
      HAL_ID = {hal-00537834},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  16. Ali Alaeldine, Richard Perdriau, Mohamed Ramdani, Jean-Luc Levant A Direct Power Injection Model for Immunity Prediction in Integrated Circuits IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2008, 50, pp.52-62
    @article{alaeldine:hal-00316535,
      TITLE = {{A Direct Power Injection Model for Immunity Prediction in Integrated Circuits}},
      AUTHOR = {Alaeldine, Ali and Perdriau, Richard and Ramdani, Mohamed and Levant, Jean-Luc},
      URL = {https://hal.archives-ouvertes.fr/hal-00316535},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {50},
      PAGES = {52-62},
      YEAR = {2008},
      MONTH = Feb,
      KEYWORDS = {modeling ; simulation ; DPI ; IC ; EMC ; immunity},
      PDF = {https://hal.archives-ouvertes.fr/hal-00316535/file/IEEE-EMC_final_accepted_.pdf},
      HAL_ID = {hal-00316535},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper introduces a complete simulation model of a Direct Power Injection (DPI) setup, used to measure the immunity of integrated circuits to conducted continuous-wave interference. This model encompasses the whole measurement setup itself as well as the integrated circuit under test and its environment (printed circuit board, power supply). Furthermore, power losses are theoretically computed, and the most significant ones are included in the model. Therefore, the injected power level causing a malfunction of an integrated circuit, according to a given criterion, can be identified and predicted at any frequency up to 1 GHz. In addition to that, the relationship between immunity and impedance is illustrated. Simulation results obtained from the model are compared to measurement results and demonstrate the validity of this approach.
  17. Ali Alaeldine, Richard Perdriau, Mohamed Ramdani, V. Veeragandham Electrical Model for Power Losses in Direct Power Injection iet proceeding on science, measurement and technology, 2007, pp.284-289
    @article{alaeldine:hal-00239391,
      TITLE = {{Electrical Model for Power Losses in Direct Power Injection}},
      AUTHOR = {Alaeldine, Ali and Perdriau, Richard and Ramdani, Mohamed and Veeragandham, V.},
      URL = {https://hal.archives-ouvertes.fr/hal-00239391},
      JOURNAL = {{iet proceeding on science, measurement and technology}},
      PAGES = {284-289},
      YEAR = {2007},
      MONTH = Sep,
      HAL_ID = {hal-00239391},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  18. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi EMC assessment at chip and PCB level: use of the ICEM model for jitter analysis in an integrated PLL IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2007, 49, pp.182-191
    @article{levant:hal-00438288,
      TITLE = {{EMC assessment at chip and PCB level: use of the ICEM model for jitter analysis in an integrated PLL}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00438288},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {49},
      PAGES = {182-191},
      YEAR = {2007},
      MONTH = Feb,
      HAL_ID = {hal-00438288},
      HAL_VERSION = {v1},
    }
     
    Abstract...

Conference papers

  1. Ala Ayed, Sjoerd Op'T Land, Richard Perdriau, Mohamed Ramdani Fastlmmunity: An EDA extension for PCB immunity prediction Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), May 2016, Shenzhen, China. IEEE, pp.207--210, 2016, Asia-Pacific International Symposium on Electromagnetic Compatibility
    @inproceedings{ayed:hal-01479173,
      TITLE = {{Fastlmmunity: An EDA extension for PCB immunity prediction}},
      AUTHOR = {Ayed, Ala and Op't Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal-univ-rennes1.archives-ouvertes.fr/hal-01479173},
      BOOKTITLE = {{Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)}},
      ADDRESS = {Shenzhen, China},
      PUBLISHER = {{IEEE}},
      SERIES = {Asia-Pacific International Symposium on Electromagnetic Compatibility},
      PAGES = {207--210},
      YEAR = {2016},
      MONTH = May,
      HAL_ID = {hal-01479173},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Predicting the immunity of printed circuit boards (PCBs) to radiated electromagnetic interference (EMI) requires the computation of the electromagnetic field's coupling to PCB traces. A modified Taylor-based analytical model exists developed and validated for PCB's immunity prediction. In this paper, we present the methodology of development of an electronic design automation (EDA) extension for Altium Designer based on the prediction model. The developed extension allows PCB designers to have further insight on PCBs immunity during design phase and implements a unique electromagnetic compatibility (EMC) feature compared to existing EMC tools.
  2. A. Ayed, Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani FastImmunity: An EDA extension for PCB immunity prediction 7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016, May 2016, Shenzhen, China. Institute of Electrical and Electronics Engineers Inc., pp.207--210, 2016, 〈10.1109/APEMC.2016.7523011〉
    @inproceedings{ayed:hal-01368134,
      TITLE = {{FastImmunity: An EDA extension for PCB immunity prediction}},
      AUTHOR = {Ayed, A. and Op 't Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal-univ-rennes1.archives-ouvertes.fr/hal-01368134},
      BOOKTITLE = {{7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016}},
      ADDRESS = {Shenzhen, China},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers Inc.}},
      PAGES = {207--210},
      YEAR = {2016},
      MONTH = May,
      DOI = {10.1109/APEMC.2016.7523011},
      KEYWORDS = { Radiated electromagnetic interferences ;  Printed circuit board (PCBs) ;  Electromagnetic fields ;  Electromagnetic pulse ;  Electronic design automation ;  Forecasting ;  Polychlorinated biphenyls ;  Printed circuits ;  Altium Designer ;  Design phase ;  EDA extension ;  PCB designers ;  Prediction model ;  Electromagnetic compatibility ;  Design ; Computer aided design ;  Printed circuit boards},
      HAL_ID = {hal-01368134},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Predicting the immunity of printed circuit boards (PCBs) to radiated electromagnetic interference (EMI) requires the computation of the electromagnetic field's coupling to PCB traces. A modified Taylor-based analytical model exists developed and validated for PCB's immunity prediction. In this paper, we present the methodology of development of an electronic design automation (EDA) extension for Altium Designer based on the prediction model. The developed extension allows PCB designers to have further insight on PCBs immunity during design phase and implements a unique electromagnetic compatibility (EMC) feature compared to existing EMC tools. © 2016 IEEE.
  3. M. Stojanovic, F. Lafont, Priscillia Fernandez-Lopez, Sjoerd Op 'T Land, Richard Perdriau Modified Kron's Method (MKME) for EMC optimization, applied to an EMC filter 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), May 2016, SHENZHEN, China. 01, pp.782-784, 2016, 〈10.1109/APEMC.2016.7522865〉
    @inproceedings{stojanovic:hal-01400120,
      TITLE = {{Modified Kron's Method (MKME) for EMC optimization, applied to an EMC filter}},
      AUTHOR = {Stojanovic, M. and Lafont, F. and Fernandez-Lopez, Priscillia and Op 't Land, Sjoerd and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01400120},
      BOOKTITLE = {{2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)}},
      ADDRESS = {SHENZHEN, China},
      VOLUME = {01},
      PAGES = {pp.782-784},
      YEAR = {2016},
      MONTH = May,
      DOI = {10.1109/APEMC.2016.7522865},
      KEYWORDS = {Radio frequency ; Electromagnetic Compatibility (EMC) ; electromagnetic compatibility ; power filters ; 3D simulation ; EMC filter ; EMC optimization ; LC filters ; MKME method ; PSpice techniques ; filter designers ; filter responses ; inter-component parasitic couplings ; modified Kron's method ; Capacitors ; LC circuits ; Modified Kron's Method for EMC (MKME)},
      HAL_ID = {hal-01400120},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    In filter design, inter-component parasitic couplings play a major role in the filter response. Most often, filter designers try to minimize these couplings through a proper implementation of components; conversely, this paper aims to optimize filter responses through a clever use of these couplings. Previous works have been performed to reach such an objective ([1]-[2]), focusing on the study of LC filters with 3D simulation or PSpice techniques. Moreover, the MKME method has been identified as a promising technique in many design cases. The objective of this paper is to introduce the application of the MKME method to an LC filter, to validate its use and benefits, before deploying it for more complex filter structures.
  4. Mohamed Amellal, Ali Ahaitouf, Mohamed Ramdani, Richard Perdriau Comparaison entre les critères fonctionnel et électrique pour l’immunité électromagnétique conduite des mémoires EEPROM Colloque International TELECOM'2015 & 9èmes JFMMA, May 2015, Meknès, Maroc
    @inproceedings{amellal:hal-01169585,
      TITLE = {{Comparaison entre les crit{\`e}res fonctionnel et {\'e}lectrique pour l'immunit{\'e} {\'e}lectromagn{\'e}tique conduite des m{\'e}moires EEPROM}},
      AUTHOR = {Amellal, Mohamed and Ahaitouf, Ali and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01169585},
      BOOKTITLE = {{Colloque International TELECOM'2015 \& 9{\`e}mes JFMMA}},
      ADDRESS = {Mekn{\`e}s, Morocco},
      YEAR = {2015},
      MONTH = May,
      HAL_ID = {hal-01169585},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  5. Mohamed Amellall, Sjoerd Land, Richard Perdriau, Mohamed Ramdani, Ali Ahaitouf, Mhamed Drissi Direct power injection on functional and non-functional signals of SPI EEPROM memories Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop, Nov 2015, EDINBURGH, United Kingdom. pp.24--28, 2015, 〈10.1109/EMCCompo.2015.7358324 〉
    @inproceedings{amellall:hal-01380047,
      TITLE = {{Direct power injection on functional and non-functional signals of SPI EEPROM memories}},
      AUTHOR = {Amellall, Mohamed and Land, Sjoerd Op 't and Perdriau, Richard and Ramdani, Mohamed and Ahaitouf, Ali and Drissi, Mhamed},
      URL = {https://hal-univ-rennes1.archives-ouvertes.fr/hal-01380047},
      BOOKTITLE = {{Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop}},
      ADDRESS = {EDINBURGH, United Kingdom},
      PAGES = {24--28},
      YEAR = {2015},
      MONTH = Nov,
      DOI = {10.1109/EMCCompo.2015.7358324 },
      KEYWORDS = {integrated-circuits},
      HAL_ID = {hal-01380047},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper deals with the conducted immunity of SPI EEPROM memories. The design and implementation of a wideband radio frequency-baseband multiplexer are described. This multiplexer makes it possible to superimpose radio frequency noise to a functional baseband signal with controlled and repeatable transfer characteristics. The baseband path has a measured DC - 380MHz bandwidth, while the radio frequency path (up to 1W) has a 150kHz - 5GHz bandwidth. This multiplexer is used to compare the conducted immunity of functional and non-functional pins of EEPROM memories with a single measurement set-up.
  6. Sjoerd Op 'T Land, Olga Tereshchenko, Mohamed Ramdani, Frank Leferink, Richard Perdriau Printed Circuit Board Permittivity Measurement Using Waveguide and Resonator Rings EMC'14, May 2014, Tokyo, Japan
    @inproceedings{optland:hal-01169596,
      TITLE = {{Printed Circuit Board Permittivity Measurement Using Waveguide and Resonator Rings}},
      AUTHOR = {Op 't Land, Sjoerd and Tereshchenko, Olga and Ramdani, Mohamed and Leferink, Frank and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01169596},
      BOOKTITLE = {{EMC'14}},
      ADDRESS = {Tokyo, Japan},
      YEAR = {2014},
      MONTH = May,
      KEYWORDS = {waveguide ; resonator ring ; PCB ; FR4 ; substrate ; permittivity ; material characterisation ; microstrip},
      PDF = {https://hal.archives-ouvertes.fr/hal-01169596/file/OptLandTereshchenko_FR4_Permittivity-local.pdf},
      HAL_ID = {hal-01169596},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Knowing the frequency dependent complex permittivity of Printed Circuit Board (PCB) substrates is important in modern electronics. In this paper, two methods for measuring the permittivity are applied to the same Flame Resistant (FR4) substrate and the results are compared. The reference measurement is performed by inserting the sample in a rectangular waveguide and measuring the scattering parameters. The other measurement is performed by etching a microstrip ring resonator on the same substrate and measuring the scattering parameters. The results are similar and suggest isotropy and homogeneity.
  7. Mohamed Amellal, Mohamed Ramdani, Richard Perdriau, Mathieu Médina, M'Hamed Drissi, Ali Ahaitouf The conducted immunity of SPI EEPROM memories Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on, Sep 2013, Brugge, Belgium. pp.926 - 930, 2013
    @inproceedings{amellal:hal-00924246,
      TITLE = {{The conducted immunity of SPI EEPROM memories}},
      AUTHOR = {Amellal, Mohamed and Ramdani, Mohamed and Perdriau, Richard and M{\'e}dina, Mathieu and Drissi, M'Hamed and Ahaitouf, Ali},
      URL = {https://hal.archives-ouvertes.fr/hal-00924246},
      BOOKTITLE = {{Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on}},
      ADDRESS = {Brugge, Belgium},
      PAGES = {926 - 930},
      YEAR = {2013},
      MONTH = Sep,
      KEYWORDS = {EEPROM electromagnetic compatibility integrated circuit manufacture Immunity measurement},
      PDF = {https://hal.archives-ouvertes.fr/hal-00924246/file/The_Conducted_Immunity_of_SPI_EEPROM_Memories.pdf},
      HAL_ID = {hal-00924246},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper focus on the conducted immunity measurement of non-volatile memories up to 1 GHz. A specific measurement flow is introduced, which makes possible to compare the EMC performances in different test cases. Trough measurements and simulation, this study gives a real view on the immunity difference of this integrated circuits (IC).
  8. Sjoerd Op 'T Land, Tvrtko Mandić, Mohamed Ramdani, Adrijan Barić, Richard Perdriau, Bart Nauwelaers Comparison of Field-To-Line Coupling Models: Coupled Transmission Lines Model versus Single-cell Corrected Taylor Model Electromagnetic Compatibility (EMC EUROPE 2013), The 2013 International Symposium on, Sep 2013, Brugge, Belgium. pp.276-281, 2013
    @inproceedings{optland:hal-00923674,
      TITLE = {{Comparison of Field-To-Line Coupling Models: Coupled Transmission Lines Model versus Single-cell Corrected Taylor Model}},
      AUTHOR = {Op 'T Land, Sjoerd and Mandi{\'c}, Tvrtko and Ramdani, Mohamed and Bari{\'c}, Adrijan and Perdriau, Richard and Nauwelaers, Bart},
      URL = {https://hal.archives-ouvertes.fr/hal-00923674},
      BOOKTITLE = {{Electromagnetic Compatibility (EMC EUROPE 2013), The 2013 International Symposium on}},
      ADDRESS = {Brugge, Belgium},
      PAGES = {276-281},
      YEAR = {2013},
      MONTH = Sep,
      KEYWORDS = {EMC ; immunity ; field-to-line coupling ; microstrip ; PCB ; TEM cell ; GTEM cell},
      PDF = {https://hal.archives-ouvertes.fr/hal-00923674/file/OptLandMandic-Field_to_line_final_v3-local.pdf},
      HAL_ID = {hal-00923674},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Models for field-to-line coupling are interesting be- cause they help to predict the immunity of PCBs and explain the relation between routing and immunity. In this article a meandered PCB trace illuminated by EM field in a TEM cell is analysed. The near-end and far-end coupling is predicted using two models: a detailed and an approximative one. The detailed model is a circuit of coupled multi-conductor transmission lines evaluated with a circuit simulator. The approximative model consists of a single Taylor cell with an analytical modification evaluated using a numerical computing tool. Both predictions are compared with measurements and turn out to be equally precise. The advantage of the coupled lines model is its flexibility, the advantage of the modified Taylor model is its ease of use.
  9. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Olivier Maurice, M'Hamed Drissi Kron Simulation of Field-to-line Coupling Using a Meshed and a Modified Taylor Cell Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), The 9th International Workshop on, Dec 2013, Nara, Japan. pp.1-6, 2012
    @inproceedings{optland:hal-00923660,
      TITLE = {{Kron Simulation of Field-to-line Coupling Using a Meshed and a Modified Taylor Cell}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Maurice, Olivier and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00923660},
      BOOKTITLE = {{Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), The 9th International Workshop on}},
      ADDRESS = {Nara, Japan},
      PAGES = {1-6},
      YEAR = {2013},
      MONTH = Dec,
      KEYWORDS = {PCB ; EMC ; field-to-line coupling ; immunity ; microstrip ; Kron ; frequency-adaptive meshing ; modified Taylor},
      PDF = {https://hal.archives-ouvertes.fr/hal-00923660/file/OptLandTaylorKron-local.pdf},
      HAL_ID = {hal-00923660},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Printed Circuit Board (PCB) traces play a role in the immunity of electronic products. Contrary to Integrated Circuits (ICs), the layout of PCB traces can be changed rather late in a product's design. Therefore, it is interesting to equip the PCB designer with simple tools that predict the immunity of his PCB traces. In this article, we compare two simulations of field-to-long line coupling based on Taylor's model. Firstly, the line is meshed into electrically short Taylor cells and numerically simulated using Kron's method. Secondly, we use one modified Taylor cell, which does not need meshing and is a closed-form, analytical result. The two simulations turn out to be equally precise on a straight microstrip line, the meshed simulation being more flexible, the simulation using a modified Taylor cell being faster.
  10. Mohamed Amellal, Sarrah Amor, Geneviève Duchamp, Ali Ahaitouf, J.P. Salvestrini, Laurent Béchou, Mohamed Ramdani, Richard Perdriau OPTIMIST - Optimisation et caractérisations de composants sous agressions environnantes TELECOM2013 & 8eme JFMMA, Mar 2013, Marrakech, Maroc. pp.xx-yy, 2013
    @inproceedings{amellal:hal-00844431,
      TITLE = {{OPTIMIST - Optimisation et caract{\'e}risations de composants sous agressions environnantes}},
      AUTHOR = {Amellal, Mohamed and Amor, Sarrah and Duchamp, Genevi{\`e}ve and Ahaitouf, Ali and Salvestrini, J.P. and B{\'e}chou, Laurent and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-00844431},
      BOOKTITLE = {{TELECOM2013 \& 8eme JFMMA}},
      ADDRESS = {Marrakech, Morocco},
      PAGES = {xx-yy},
      YEAR = {2013},
      MONTH = Mar,
      HAL_ID = {hal-00844431},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  11. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Ignacio Gil, Frédéric Lafon, M'Hamed Drissi Design of a 20 GHz DPI method for SOIC8 Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on, Sep 2012, Rome, Italy. pp.1-6, 2012, 〈10.1109/EMCEurope.2012.6396691〉
    @inproceedings{optland:hal-00776483,
      TITLE = {{Design of a 20 GHz DPI method for SOIC8}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Gil, Ignacio and Lafon, Fr{\'e}d{\'e}ric and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00776483},
      BOOKTITLE = {{Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on}},
      ADDRESS = {Rome, Italy},
      PAGES = {1-6},
      YEAR = {2012},
      MONTH = Sep,
      DOI = {10.1109/EMCEurope.2012.6396691},
      KEYWORDS = {DPI ; EMC ; GHz ; calibration ; centrimetre ; crosstalk ; immunity ; integrated circuit ; loss ; low-cost ; modelling},
      PDF = {https://hal.archives-ouvertes.fr/hal-00776483/file/OptLand_Centimetre_DPI-local.pdf},
      HAL_ID = {hal-00776483},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to determine the power Ptrans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk.
  12. S.Y. Yuan, Y.L. Wu, Richard Perdriau, S.S. Liao, H.P. Ho Electromagnetic Interference Analysis using an Embedded Phase-Lock Loop APEMC 2012, May 2012, Singapore, Singapore. 2012
    @inproceedings{yuan:hal-01158639,
      TITLE = {{Electromagnetic Interference Analysis using an Embedded Phase-Lock Loop}},
      AUTHOR = {Yuan, S.Y. and Wu, Y.L. and Perdriau, Richard and Liao, S.S. and Ho, H.P.},
      URL = {https://hal.archives-ouvertes.fr/hal-01158639},
      BOOKTITLE = {{APEMC 2012}},
      ADDRESS = {Singapore, Singapore},
      YEAR = {2012},
      MONTH = May,
      HAL_ID = {hal-01158639},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  13. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Frédéric Lafon Towards nonlinearity measurement and simulation using common EMC equipment Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on, Nov 2011, Dubrovnik, Croatia. pp.125-130, 2011
    @inproceedings{optland:hal-00776498,
      TITLE = {{Towards nonlinearity measurement and simulation using common EMC equipment}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Lafon, Fr{\'e}d{\'e}ric},
      URL = {https://hal.archives-ouvertes.fr/hal-00776498},
      BOOKTITLE = {{Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on}},
      ADDRESS = {Dubrovnik, Croatia},
      PAGES = {125-130},
      YEAR = {2011},
      MONTH = Nov,
      KEYWORDS = {modeling ; linearity hypothesis ; immunity ; integrated circuit ; DPI ; ICIM-CI ; X-parameters},
      PDF = {https://hal.archives-ouvertes.fr/hal-00776498/file/OptLand-Towards_Nonlinearity_Measurement_and_Simulation_Using_Common_EMC_Equipment-local.pdf},
      HAL_ID = {hal-00776498},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Integrated circuit (IC) models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). The integrated circuit immunity model for conducted immunity (ICIM-CI) of IEC 62433-4 assumes that the IC terminals still behave linearly at injection power levels that cause susceptibility. This hypothesis should be systematically verified when modelling integrated circuits for EMC, but this is not always straightforward. A simple measurement set-up using a directional coupler and a spectrum analyser is demonstrated to verify this linearity hypothesis using commonly available equipment. The measured reflected spectrum can be transformed into the |X11| parameter, which is the non-linear extension of the S11 parameter. X-parameters may be the key to predict susceptibility by simulation when the linearity hypothesis is invalid.
  14. Richard Perdriau, O. Maurice, S. Dubois, Mohamed Ramdani, E. Sicard Assessment of the Radiated Immunity of Integrated Circuits in the 3-40 GHz Range EMC Compo 2011, 2011, Dubrovnik, Croatia. 2011
    @inproceedings{perdriau:hal-01158674,
      TITLE = {{Assessment of the Radiated Immunity of Integrated Circuits in the 3-40 GHz Range}},
      AUTHOR = {Perdriau, Richard and Maurice, O. and Dubois, S. and Ramdani, Mohamed and Sicard, E.},
      URL = {https://hal.archives-ouvertes.fr/hal-01158674},
      BOOKTITLE = {{EMC Compo 2011}},
      ADDRESS = {Dubrovnik, Croatia},
      YEAR = {2011},
      HAL_ID = {hal-01158674},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  15. Frédéric Lafon, Mohamed Ramdani, Frédéric De Daran, Richard Perdriau, M'Hamed Drissi Modélisation de l'immunité des circuits intégrés en contexte industriel CEM 2010, Apr 2010, Limoges, France. 2010
    @inproceedings{lafon:hal-00511449,
      TITLE = {{Mod{\'e}lisation de l'immunit{\'e} des circuits int{\'e}gr{\'e}s en contexte industriel}},
      AUTHOR = {Lafon, Fr{\'e}d{\'e}ric and Ramdani, Mohamed and De Daran, Fr{\'e}d{\'e}ric and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00511449},
      BOOKTITLE = {{CEM 2010}},
      ADDRESS = {Limoges, France},
      YEAR = {2010},
      MONTH = Apr,
      HAL_ID = {hal-00511449},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  16. F. Lafon, Mohamed Ramdani, F. Daran, R. Perdriau, O. Maurice, M. Drissi Modélisation de l'immunité des circuits intégrés - Passé, présent, et nouveaux challenges pour la normalisation CEM 2010, Apr 2010, Limoges, France. 2010
    @inproceedings{lafon:hal-01161574,
      TITLE = {{Mod{\'e}lisation de l'immunit{\'e} des circuits int{\'e}gr{\'e}s - Pass{\'e}, pr{\'e}sent, et nouveaux challenges pour la normalisation}},
      AUTHOR = {Lafon, F. and Ramdani, Mohamed and Daran, F. de and Perdriau, R. and Maurice, O. and Drissi, M.},
      URL = {https://hal.archives-ouvertes.fr/hal-01161574},
      BOOKTITLE = {{CEM 2010}},
      ADDRESS = {Limoges, France},
      YEAR = {2010},
      MONTH = Apr,
      HAL_ID = {hal-01161574},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    no abstract
  17. Frédéric Lafon, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi, Frédéric De Daran An Industry-Compliant Immunity Modeling Technique for Integrated Circuits International Symposium on Electromagnetic Compatibility (EMC 09), 2009, Kyoto, Japan. 2009
    @inproceedings{lafon:hal-00525287,
      TITLE = {{An Industry-Compliant Immunity Modeling Technique for Integrated Circuits}},
      AUTHOR = {Lafon, Fr{\'e}d{\'e}ric and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed and De Daran, Fr{\'e}d{\'e}ric},
      URL = {https://hal.archives-ouvertes.fr/hal-00525287},
      BOOKTITLE = {{International Symposium on Electromagnetic Compatibility (EMC 09)}},
      ADDRESS = {Kyoto, Japan},
      YEAR = {2009},
      HAL_ID = {hal-00525287},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  18. Frédéric Lafon, Frédéric De Daran, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi Immunity Modeling of Integrated Circuits : An Industrial Case 7th International Workshop on Electromagnetic compatibility of Integrated circuits (EMC COMPO 09), 2009, Toulouse, France. 2009
    @inproceedings{lafon:hal-00525280,
      TITLE = {{Immunity Modeling of Integrated Circuits : An Industrial Case}},
      AUTHOR = {Lafon, Fr{\'e}d{\'e}ric and De Daran, Fr{\'e}d{\'e}ric and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00525280},
      BOOKTITLE = {{7th International Workshop on Electromagnetic compatibility of Integrated circuits (EMC COMPO 09)}},
      ADDRESS = {Toulouse, France},
      YEAR = {2009},
      HAL_ID = {hal-00525280},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  19. Ali Alaeldine, Thomas Ordas, Richard Perdriau, Philippe Maurine, Mohamed Ramdani, Lionel Torres, M'Hamed Drissi Etude de l'effet du boîtier sur l'immunité en champ proche des circuits intégrés Telecom 2009 & 6èmes JFMMA, Mar 2009, Agadir, Maroc. 4 p., 2009
    @inproceedings{alaeldine:hal-00522766,
      TITLE = {{Etude de l'effet du bo{\^i}tier sur l'immunit{\'e} en champ proche des circuits int{\'e}gr{\'e}s}},
      AUTHOR = {Alaeldine, Ali and Ordas, Thomas and Perdriau, Richard and Maurine, Philippe and Ramdani, Mohamed and Torres, Lionel and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00522766},
      BOOKTITLE = {{Telecom 2009 \& 6{\`e}mes JFMMA}},
      ADDRESS = {Agadir, Morocco},
      PAGES = {4 pages},
      YEAR = {2009},
      MONTH = Mar,
      HAL_ID = {hal-00522766},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  20. Ali Alaeldine, Thomas Ordas, Richard Perdriau, Philippe Maurine, Mohamed Ramdani, Lionel Torres, M'Hamed Drissi Assessment of the Immunity of Unshielded Multicore Integrated Circuits to Near Field Injection International Zurich Symposium on Electromagnetic Compatibility, France. pp.361-364, 2009
    @inproceedings{alaeldine:lirmm-00394411,
      TITLE = {{Assessment of the Immunity of Unshielded Multicore Integrated Circuits to Near Field Injection}},
      AUTHOR = {Alaeldine, Ali and Ordas, Thomas and Perdriau, Richard and Maurine, Philippe and Ramdani, Mohamed and Torres, Lionel and Drissi, M'Hamed},
      URL = {https://hal-lirmm.ccsd.cnrs.fr/lirmm-00394411},
      BOOKTITLE = {{International Zurich Symposium on Electromagnetic Compatibility}},
      ADDRESS = {France},
      PAGES = {361-364},
      YEAR = {2009},
      MONTH = Jun,
      PDF = {https://hal-lirmm.ccsd.cnrs.fr/lirmm-00394411/file/EMC_Zurich_20091.pdf},
      HAL_ID = {lirmm-00394411},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper presents a comparative assessment of the electromagnetic immunity of 4 integrated logic cores to near-field injection. These cores, located on the same die, are identical from a functional point of view, but differ by their design strategies. The injection is performed above each core according to the 6 components of the electromagnetic field, using appropriate probes. These results demonstrate that the die and bondwires of an integrated circuit can be sensitive to both magnetic and electric fields, and that some design rules can improve the immunity of integrated circuits to near-field interference.
  21. Ali Alaeldine, Richard Perdriau, Mohamed Ramdani, Etienne Sicard, M'Hamed Drissi, A.M. Haidar Modeling of the Substrate Coupling Path for Direct Power Injection in Integrated Circuits IEEE International Symposium on Electromagnetic Compatibility, Aug 2008, Détroit, United States. 1-3, pp.362-367, 2008
    @inproceedings{alaeldine:hal-00538447,
      TITLE = {{Modeling of the Substrate Coupling Path for Direct Power Injection in Integrated Circuits}},
      AUTHOR = {Alaeldine, Ali and Perdriau, Richard and Ramdani, Mohamed and Sicard, Etienne and Drissi, M'Hamed and Haidar, A.M.},
      URL = {https://hal.archives-ouvertes.fr/hal-00538447},
      BOOKTITLE = {{IEEE International Symposium on Electromagnetic Compatibility}},
      ADDRESS = {D{\'e}troit, United States},
      VOLUME = {1-3},
      PAGES = {362-367},
      YEAR = {2008},
      MONTH = Aug,
      HAL_ID = {hal-00538447},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  22. Ali Alaeldine, Olivier Maurice, Jérome Cordi, Richard Perdriau, Mohamed Ramdani EMC-ORIENTED ANALYSIS OF ELECTRIC NEAR-FIELD IN HIGH FREQUENCY ICONIC 2007, Jun 2007, Saint Louis, United States. 2007
    @inproceedings{alaeldine:hal-00356161,
      TITLE = {{EMC-ORIENTED ANALYSIS OF ELECTRIC NEAR-FIELD IN HIGH FREQUENCY}},
      AUTHOR = {Alaeldine, Ali and Maurice, Olivier and Cordi, J{\'e}rome and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00356161},
      BOOKTITLE = {{ICONIC 2007}},
      ADDRESS = {Saint Louis, United States},
      YEAR = {2007},
      MONTH = Jun,
      KEYWORDS = {equivalent circuit ; EMC ; near field ; dipole ; Kron ; equivalent circuit.},
      PDF = {https://hal.archives-ouvertes.fr/hal-00356161/file/alaeldine-MS708.pdf},
      HAL_ID = {hal-00356161},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper introduces an EMC-oriented study of the frequency-domain behavior of the electric field generated by two dipole antennas. First of all, the theoretical expression of this field is analyzed and confronted with the macromodel commonly used in electrical circuits. Then, the most significant components of the expression are included into the topological study of a two-dipole network through Kron's method. Finally, computed results are compared with experimental ones and show significant similarities.
  23. Ali Alaeldine, Jérôme Cordi, Richard Perdriau, Mohamed Ramdani, Jean-Luc Levant Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models EMC Zurich, Sep 2007, Zurich, Switzerland. pp.79-82, 2007
    @inproceedings{alaeldine:hal-00540904,
      TITLE = {{Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models}},
      AUTHOR = {Alaeldine, Ali and Cordi, J{\'e}r{\^o}me and Perdriau, Richard and Ramdani, Mohamed and Levant, Jean-Luc},
      URL = {https://hal.archives-ouvertes.fr/hal-00540904},
      BOOKTITLE = {{EMC Zurich}},
      ADDRESS = {Zurich, Switzerland},
      PAGES = {79-82},
      YEAR = {2007},
      MONTH = Sep,
      HAL_ID = {hal-00540904},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  24. Nicolas Lacrampe, Ali Alaeldine, Fabrice Caignet, Richard Perdriau, Marise Bafleur, Mohamed Ramdani Investigation on ESD Transient Immunity of Integrated Circuit IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007
    @inproceedings{lacrampe:hal-00239408,
      TITLE = {{Investigation on ESD Transient Immunity of Integrated Circuit}},
      AUTHOR = {Lacrampe, Nicolas and Alaeldine, Ali and Caignet, Fabrice and Perdriau, Richard and Bafleur, Marise and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00239408},
      BOOKTITLE = {{IEEE EMC 2007 International Symposium on Electromagnetic Compatibility}},
      ADDRESS = {Honolulu (Hawaii), United States},
      YEAR = {2007},
      MONTH = Jul,
      HAL_ID = {hal-00239408},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  25. Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard, M'Hamed Drissi A Near-Field Injection Model Including Power Losses for Susceptibility Prediction in Integrated Circuits 5 èmes JFMMA and TELECOM 2007, Mar 2007, Fès, Morocco. 2007
    @inproceedings{alaeldine:hal-00239426,
      TITLE = {{A Near-Field Injection Model Including Power Losses for Susceptibility Prediction in Integrated Circuits}},
      AUTHOR = {Alaeldine, Ali and Boyer, Alexandre and Perdriau, Richard and Ramdani, Mohamed and Sicard, Etienne and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00239426},
      BOOKTITLE = {{5 {\`e}mes JFMMA and TELECOM 2007}},
      ADDRESS = {F{\`e}s, Morocco},
      YEAR = {2007},
      MONTH = Mar,
      HAL_ID = {hal-00239426},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  26. V. Verma, S. Merhi, M. Tormos, Ali Alaeldine, Richard Perdriau, Mohamed Ramdani Towards an EMI immunity analysis for an embedded analog-to-digital converter 2emc IEEE symposium on embedded EMC, Oct 2007, Rouen, France. 2007
    @inproceedings{verma:hal-00239435,
      TITLE = {{Towards an EMI immunity analysis for an embedded analog-to-digital converter}},
      AUTHOR = {Verma, V. and Merhi, S. and Tormos, M. and Alaeldine, Ali and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00239435},
      BOOKTITLE = {{2emc IEEE symposium on embedded EMC}},
      ADDRESS = {Rouen, France},
      YEAR = {2007},
      MONTH = Oct,
      HAL_ID = {hal-00239435},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  27. Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard, M'Hamed Drissi Near Field Injection Model Including Power Losses for Susceptibility Prediction in ICs EMC Europe Workshop 2007, Jun 2007, Paris, France. 2007
    @inproceedings{alaeldine:hal-00239430,
      TITLE = {{Near Field Injection Model Including Power Losses for Susceptibility Prediction in ICs}},
      AUTHOR = {Alaeldine, Ali and Boyer, Alexandre and Perdriau, Richard and Ramdani, Mohamed and Sicard, Etienne and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00239430},
      BOOKTITLE = {{EMC Europe Workshop 2007}},
      ADDRESS = {Paris, France},
      YEAR = {2007},
      MONTH = Jun,
      HAL_ID = {hal-00239430},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  28. Ali Alaeldine, Alexandre Boyer, Richard Perdriau, Mohamed Ramdani, Etienne Sicard A Near-Field Injection Model for Susceptibility Prediction in Integrated Circuits ICONIC 2007, Jun 2007, Saint-Louis, United States. 2007
    @inproceedings{alaeldine:hal-00239422,
      TITLE = {{A Near-Field Injection Model for Susceptibility Prediction in Integrated Circuits}},
      AUTHOR = {Alaeldine, Ali and Boyer, Alexandre and Perdriau, Richard and Ramdani, Mohamed and Sicard, Etienne},
      URL = {https://hal.archives-ouvertes.fr/hal-00239422},
      BOOKTITLE = {{ICONIC 2007}},
      ADDRESS = {Saint-Louis, United States},
      YEAR = {2007},
      MONTH = Jun,
      HAL_ID = {hal-00239422},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  29. Ali Alaeldine, Nicolas Lacrampe, Fabrice Caignet, Richard Perdriau, Marise Bafleur, Mohamed Ramdani, M'Hamed Drissi, Jean-Luc Levant, Etienne Sicard Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007
    @inproceedings{alaeldine:hal-00239403,
      TITLE = {{Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection}},
      AUTHOR = {Alaeldine, Ali and Lacrampe, Nicolas and Caignet, Fabrice and Perdriau, Richard and Bafleur, Marise and Ramdani, Mohamed and Drissi, M'Hamed and Levant, Jean-Luc and Sicard, Etienne},
      URL = {https://hal.archives-ouvertes.fr/hal-00239403},
      BOOKTITLE = {{IEEE EMC 2007 International Symposium on Electromagnetic Compatibility}},
      ADDRESS = {Honolulu (Hawaii), United States},
      YEAR = {2007},
      MONTH = Jul,
      HAL_ID = {hal-00239403},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  30. A. El Abbazi, M. Ramdani, J.L. Levant, M'Hamed Drissi, R. Perdriau Optimization of a New Septum Shape for a TEM Cell by 3D Electromagnetic Simulation EMC Compo 2005, Nov 2005, Munich, Germany. 2005
    @inproceedings{elabbazi:hal-00721081,
      TITLE = {{Optimization of a New Septum Shape for a TEM Cell by 3D Electromagnetic Simulation}},
      AUTHOR = {El Abbazi, A. and Ramdani, M. and Levant, J.L. and Drissi, M'Hamed and Perdriau, R.},
      URL = {https://hal.archives-ouvertes.fr/hal-00721081},
      BOOKTITLE = {{EMC Compo 2005}},
      ADDRESS = {Munich, Germany},
      YEAR = {2005},
      MONTH = Nov,
      HAL_ID = {hal-00721081},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  31. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi ICEM (Integrated Circuit Electromagnetic Model) Approach Workshop EMC Zurich 2005, Feb 2005, Zürich, Switzerland. 2005
    @inproceedings{levant:hal-00721254,
      TITLE = {{ICEM (Integrated Circuit Electromagnetic Model) Approach}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00721254},
      BOOKTITLE = {{Workshop EMC Zurich 2005}},
      ADDRESS = {Z{\"u}rich, Switzerland},
      YEAR = {2005},
      MONTH = Feb,
      HAL_ID = {hal-00721254},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  32. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi PLL Jitter Improvement using ICEM Architecture Workshop EMC Zurich 2005, Feb 2005, Zürich, Switzerland. 2005
    @inproceedings{levant:hal-00721256,
      TITLE = {{PLL Jitter Improvement using ICEM Architecture}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00721256},
      BOOKTITLE = {{Workshop EMC Zurich 2005}},
      ADDRESS = {Z{\"u}rich, Switzerland},
      YEAR = {2005},
      MONTH = Feb,
      HAL_ID = {hal-00721256},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  33. Adil El Abbazi, Mohamed Ramdani, Jean-Luc Levant, M'Hamed Drissi, Richard Perdriau Electromagnetic Characterization of a Microcontroller on a PCB : ICEM Model International Conference on Electromagnetic Near-Field Characterization (ICONIC), Jun 2005, Barcelone, Spain. pp.448-452, 2005
    @inproceedings{elabbazi:hal-00720517,
      TITLE = {{Electromagnetic Characterization of a Microcontroller on a PCB : ICEM Model}},
      AUTHOR = {El Abbazi, Adil and Ramdani, Mohamed and Levant, Jean-Luc and Drissi, M'Hamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-00720517},
      BOOKTITLE = {{International Conference on Electromagnetic Near-Field Characterization (ICONIC)}},
      ADDRESS = {Barcelone, Spain},
      PAGES = {448-452},
      YEAR = {2005},
      MONTH = Jun,
      HAL_ID = {hal-00720517},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  34. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi Exploitation of the ICEM Model for Jitter Analysis in an Integrated PLL The 19th Conference on Design of Circuits and Integrated Systems, Nov 2004, Bordeaux, France
    @inproceedings{levant:hal-00908050,
      TITLE = {{Exploitation of the ICEM Model for Jitter Analysis in an Integrated PLL}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00908050},
      BOOKTITLE = {{The 19th Conference on Design of Circuits and Integrated Systems}},
      ADDRESS = {Bordeaux, France},
      YEAR = {2004},
      MONTH = Nov,
      HAL_ID = {hal-00908050},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  35. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi An Integrated Circuit Electromagnetic Model for EMC Assessment at Chip and PCB Level The 19th Conference on Design of Circuits and Integrated Systems, Nov 2004, Bordeaux, France
    @inproceedings{levant:hal-00908065,
      TITLE = {{An Integrated Circuit Electromagnetic Model for EMC Assessment at Chip and PCB Level}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00908065},
      BOOKTITLE = {{The 19th Conference on Design of Circuits and Integrated Systems}},
      ADDRESS = {Bordeaux, France},
      YEAR = {2004},
      MONTH = Nov,
      HAL_ID = {hal-00908065},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  36. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi Méthodologie de prédiction et d'optimisation de la CEM des circuits intégrés Conférence invitée au workshop de l'AS CEM du GDR ondes, Jun 2004, Paris, France
    @inproceedings{levant:hal-00836817,
      TITLE = {{M{\'e}thodologie de pr{\'e}diction et d'optimisation de la CEM des circuits int{\'e}gr{\'e}s}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00836817},
      BOOKTITLE = {{Conf{\'e}rence invit{\'e}e au workshop de l'AS CEM du GDR ondes}},
      ADDRESS = {Paris, France},
      YEAR = {2004},
      MONTH = Jun,
      HAL_ID = {hal-00836817},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  37. Alain Le Duff, Guy Plantier, Jean-Christophe Valiere, Richard Perdriau Acoustic Velocity Measurements in the Air by Means of Laser Doppler Velocimetry: Cramer-Rao Bounds and Maximum Likelihood Estimation IEEE International Conference on Acoustics, Speech, and Signal Processing - ICASSP'02, May 2002, Orlando, United States. pp.1325--1328
    @inproceedings{leduff:hal-01206839,
      TITLE = {{Acoustic Velocity Measurements in the Air by Means of Laser Doppler Velocimetry: Cramer-Rao Bounds and Maximum Likelihood Estimation}},
      AUTHOR = {Le Duff, Alain and Plantier, Guy and Valiere, Jean-Christophe and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01206839},
      BOOKTITLE = {{IEEE International Conference on Acoustics, Speech, and Signal Processing - ICASSP'02}},
      ADDRESS = {Orlando, United States},
      NUMBER = {2},
      PAGES = {1325--1328},
      YEAR = {2002},
      MONTH = May,
      HAL_ID = {hal-01206839},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This paper considers the problem of estimating acoustic particle velocity and convection velocity in the air by means of laser Doppler velocity (LDV) measurement. Closed-form for the Cramer-Rao bounds (CRB) on the estimates of the velocity parameters, for a sine wave excitation, are derived and simplified expressions are given. Moreover, a maximum likelihood estimator (MLE) and a signal phase derivative-based estimator (DBE) are proposed. Finally, estimator performance is illustrated by means of Monte Carlo simulations obtained from synthesized signals and the statistical efficiency of the MLE is checked out.
  38. Richard Perdriau, Damien Lambert, Anne-Marie Trullemans, Mohamed Ramdani A VHDL-AMS Simulation Methodology for Transient Supply Current Extraction 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp.99-104, 2002
    @inproceedings{perdriau:hal-00526234,
      TITLE = {{A VHDL-AMS Simulation Methodology for Transient Supply Current Extraction}},
      AUTHOR = {Perdriau, Richard and Lambert, Damien and Trullemans, Anne-Marie and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00526234},
      BOOKTITLE = {{3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits}},
      ADDRESS = {Toulouse, France},
      NUMBER = {ISBN 2-87649-043-9},
      PAGES = {99-104},
      YEAR = {2002},
      MONTH = Nov,
      KEYWORDS = {EMC ; IC ; emission ; immunity ; susceptibility ; modelling ; IEC ; integrated circuit ; electromagnetic compatibility},
      PDF = {https://hal.archives-ouvertes.fr/hal-00526234/file/TOPIC7_PERDRIAU.PDF},
      HAL_ID = {hal-00526234},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Transient supply current extraction plays a very important role in estimating performance level in the IC ElectroMagnetic Compatibility (EMC) field. Until now, average supply current estimations have been carried out for low-power design purposes, but they do not take into account high-frequency emission created by dI/dt effects. As far as complex circuits such as microcontrollers (uC) are concerned, transistor-level (SPICE-based) simulation leads to very long CPU times, mainly because of memory arrays which often represent more than 80 % of the transistors in a uC. VHDL-AMS simulators like ADVance-MS (Mentor Graphics) allow the designer to describe memories at the behavioral level while keeping the microcontroller core itself at the structural level. Moreover, seeing that very high accuracy is not needed for EMC studies, the use of much faster but less accurate simulation tools like Mach (Mentor Graphics) is made possible. In the first step, the dynamic supply current consumption of the uC core alone is simulated by coupling purely digital (VITAL) VHDL models for Flash and RAM blocks (providing only code and data) to the transistor-level core. The next step consists in adding VHDL-AMS behavioral models of the consumption of the memory blocks themselves to the VITAL descriptions. These models may take into account the addressing scheme and a statistical estimation of the contents of the arrays. This allows us to deal with the whole microcontroller without dramatically increasing simulation time. Furthermore, this method should be applicable to on-chip caches for more complex microcontrollers. The whole equivalent supply current generator may then be included in the recent Integrated Circuit Electromagnetic Model (ICEM), allowing EMC designers to predict conducted emission levels before sending the chip to the foundry. Moreover, this method should indicate how much executable code may influence conducted emission, and if so, help to write EMC-friendly software. Test chips and boards have been designed in order to compare simulation results to real-world measurements (current pulses on power supply networks). This work is supported by the MESDIE project.
  39. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau Power- Supply Network Modeling INSA Toulouse, France. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, pp.75-78, 2002
    @inproceedings{levant:hal-00517798,
      TITLE = {{Power- Supply Network Modeling}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-00517798},
      BOOKTITLE = {{3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits}},
      ADDRESS = {Toulouse, France},
      EDITOR = {INSA Toulouse, France},
      PUBLISHER = {{3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits}},
      NUMBER = {ISBN 2-87649-043-9},
      PAGES = {75-78},
      YEAR = {2002},
      MONTH = Nov,
      KEYWORDS = {EMC ; IC ; emission ; immunity ; susceptibility ; modelling ; IEC ; integrated circuit ; electromagnetic compatibility},
      PDF = {https://hal.archives-ouvertes.fr/hal-00517798/file/TOPICx_LEVANT.PDF},
      HAL_ID = {hal-00517798},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    This work deals with the extraction of ICEM parameters and its validation on the power supply network of a 8-bit microcontroller. The objective of the ICEM model [1] (Integrated Circuit Electromagnetic Model) for Components is to propose electrical modeling for conducted and radiation emission prediction [2]. The ICEM model is based on two sub-models. The first one models the power network of the I.C. and the second one models the I.C. activity as a current generator. The ICEM model can be used by the I.C. supplier to check the performances of the package, the number of power pins, and the noise rejection on analogue parts, ... The electronic system suppliers will use the model to optimize the power network and the decoupling network of the PCB and finally the level of conducted and radiated emissions. In this paper, only the power network modeling of the 8-bit microcontroller core is discussed. Two methods can be used to model the power network of the I.C. The first one is based on the extraction of the parasitic elements during the design phase (silicon lay-out, package, bond wires, ...). The second one, discussed in this paper, is based on the measurement when a silicon or an equivalent design is available. These two methods are presented in the ICEM cookbook
  40. Jean-Luc Levant, Mohamed Ramdani, Richard Perdriau ICEM MODELING OF MICROCONTROLLER CURRENT ACTIVITY INSA Toulouse, France. 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2002, Toulouse, France. pp.88-91, 2002
    @inproceedings{levant:hal-00519359,
      TITLE = {{ICEM MODELING OF MICROCONTROLLER CURRENT ACTIVITY}},
      AUTHOR = {Levant, Jean-Luc and Ramdani, Mohamed and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-00519359},
      BOOKTITLE = {{3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits}},
      ADDRESS = {Toulouse, France},
      EDITOR = {INSA Toulouse, France},
      NUMBER = {ISBN 2-87649-043-9},
      PAGES = {88-91},
      YEAR = {2002},
      MONTH = Nov,
      KEYWORDS = {EMC ; IC ; emission ; immunity ; susceptibility ; modelling ; IEC ; integrated circuit ; electromagnetic compatibility},
      PDF = {https://hal.archives-ouvertes.fr/hal-00519359/file/TOPIC4_LEVANT.PDF},
      HAL_ID = {hal-00519359},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    The ICEM draft proposal deals with an extension of the IBIS [1] standard, aimed at predicting conducted-mode as well as radiated-mode emission [2]. This proposal provides a modeling methodology for the power supply network and the current activity of an integrated circuit. Thanks to these models, predicting conducted-mode emission levels on the chip as well as on the application board becomes possible by the means of SPICE-based analog simulations. This allows the chipmaker to better choose the chip package as well as the number of power supply pairs, and the integrator to fine tune the number of power supply networks and decoupling capacitors. The corresponding models may be elaborated either in the design phase or from measurements performed as soon as the silicon becomes available. This article briefly summarizes the ICEM model, then introduces the proposed methodology aimed at obtaining the current activity model from the measurements performed on the current consumed on the power supply pins of an IC.

Books

Publications (ESEO database)

Books and Theses
[1] A.M. Trullemans-Anckaert, R. Perdriau, M. Ramdani, J.L. Levant, "Prediction of Conducted-Mode Emission of Complex ICs", Chapter in Advances in Design and Specification Languages for SoCs - Selected Contributions from FDL'04, Springer, pp. 55-68, 2005. [bib]
[2] R. Perdriau, "VHDL-AMS-Based ICEM-IP Models, ATMEL Microcontroller Conducted Emission, VHDL-AMS Software: an Overview", Chapter in Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility, Springer, pp. 233-239, 346-252, 451-454, 2005. [bib]
[3] R. Perdriau, "Méthodologie de prédiction des niveaux d'émission conduite dans les circuits intégrés, à l'aide de VHDL-AMS", PhD thesis, Université Catholique de Louvain, 2004. [bib] [pdf]
Journal Papers
[4] A. Alaeldine, R. Perdriau, "A Comprehensive Simulation Model for Immunity Prediction in Integrated Circuits with respect to Substrate Injection", In Microelectronics Journal, vol. 40, no. 12, pp. 1788-1795, 2009. [bib]
[5] M.S. Karoui, H. Ghariani, M. Samet, M. Ramdani, R. Perdriau, "Four-/Five-Element Planar Log-Periodic Dipole Antennas for Medical Telemetry Applications", In International Review on Modelling and Simulations (IREMOS), vol. 2, no. 4, pp. 414-418, 2009. [bib]
[6] A. Alaeldine, R. Perdriau, M. Ramdani, J.L. Levant, M. Drissi, "A Direct Power Injection Model for Immunity Prediction in Integrated Circuits", In IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 1, pp. 52-62, 2008. [bib]
[7] M. Lahiani, M. Chaoui, H. Ghariani, R. Perdriau, "Inductive Link Modeling for Power and Data Transmission Dedicated to Cochlear Prostheses", In Transactions on Systems, Signals and Devices, vol. 2, no. 4, pp. 351-375, 2007. [bib]
[8] H. Ghariani, M. Chaoui, M. Lahiani, R. Perdriau, F. Sellami, "Reducing Load Effects on High-energy, High-efficiency Inductive Links", In Journal of Applied Sciences, vol. 6, no. 4, pp. 911-918, 2006. [bib]
[9] J.L. Levant, M. Ramdani, R. Perdriau, "ICEM Modelling of Microcontroller Current Activity", In Microelectronics Journal, vol. 35, no. 6, pp. 501-507, 2004. [bib]
[10] R. Perdriau, M. Ramdani, J.L. Levant, E. Tinlot, A.M. Trullemans-Anckaert, "An EMC-oriented VHDL-AMS Simulation Methodology for Dynamic Current Activity Assessment", In Microelectronics Journal, vol. 35, no. 6, pp. 541-546, 2004. [bib]
Peer Reviewed Conferences
[11] A. Alaeldine, T. Ordas, R. Perdriau, P. Maurine, M. Ramdani, L. Torres, M. Drissi, "Assessment of the Immunity of Unshielded Multi-Core Integrated Circuits to Near-Field Injection", In EMC Zurich 2009, 2009. [bib]
[12] T. Ordas, A. Alaeldine, P. Maurine, R. Perdriau, L. Torres, M. Ramdani, "Evaluation of Countermeasures against Electromagnetic Analysis", In EMC Europe 2009 Workshop, 2009. [bib]
[13] A. Alaeldine, L. Bouchelouk, R. Perdriau, M. Ramdani, "Analysis of the Propagation of Electromagnetic Disturbances Inside Integrated Circuits Using Direct Power Injection and Near-Field Scanning", In 2009 IEEE EMC Symposium, 2009. [bib]
[14] A. Alaeldine, L. Bouchelouk, R. Perdriau, M. Ramdani, "A Study of the Conducted Interference Induced by Near-Field Injection in Integrated Circuits", In EMC Compo 2009, 2009. [bib]
[15] J. Cordi, A. Alaeldine, J.L. Levant, R. Perdriau, M. Ramdani, P. Pinel, "Automated Extraction of the Passive Distribution Network of an Integrated Circuit for the Assessment of Conducted Electromagnetic Emission", In 2008 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2008. [bib]
[16] M. Ramdani, R. Perdriau, A. Alaeldine, "EMI Immunity Issues in Integrated Circuits: an Overview of Measurement Methods and Current Studies", In 3rd EOS/ESD/EMI Workshop (Tutorial), 2006. [bib]
[17] J.L. Levant, M. Ramdani, R. Perdriau, "Solving Internal Immunity Issues in ICs", In EMC Europe 2006 (Workshop), 2006. [bib]
[18] M. Ramdani, A. Alaeldine, R. Perdriau, "Power Modeling for Susceptibility Prediction in Integrated Circuits", In EMC Europe 2006 (Workshop), 2006. [bib]
[19] A. Alaeldine, M. Ramdani, R. Perdriau, M. Drissi, "A Direct Power Injection Model for Immunity Prediction in Integrated Circuits", In CEM06 (Special Workshop on IC Immunity), 2006. [bib]
[20] J.L. Levant, M. Ramdani, R. Perdriau, M. Drissi, "PLL Jitter Improvement using ICEM Architecture", In EMC Zurich 2005 (Workshop), 2005. [bib]
[21] J.L. Levant, M. Ramdani, R. Perdriau, M. Drissi, "ICEM (Integrated Circuit Electromagnetic Model) Approach", In EMC Zurich 2005 (Workshop), 2005. [bib]
[22] R. Perdriau, M. Ramdani, J.L. Levant, "Predicting Conducted Emission in Integrated Circuits: an ICEM-Based Reuse Methodology", In EMC Zurich 2005 (Workshop), 2005. [bib]
[23] M. Chaoui, H. Ghariani, M. Lahiani, F. Sellami, R. Perdriau, M. Ramdani, "Reducing Load Effects in Inductive Links for Implantable Systems", In IEEE International Conference on Intelligent Engineering Systems (INES 2005), 2005. [bib]
[24] A. El Abbazi, M. Ramdani, J.L. Levant, M. Drissi, R. Perdriau, "Electromagnetic Characterization of a Microcontroller on a PCB: ICEM Model", In International Conference on Near-Field Characterization and Imaging (ICONIC'2005), pp. 448-452, 2005. [bib]
[25] M. Chaoui, H. Ghariani, M. Lahiani, F. Sellami, R. Perdriau, M. Ramdani, "Reducing Load Effects in Inductive Links for Implantable Systems", In IEEE International Conference on Electronics, Circuits and Systems (ICECS 2005), 2005. [bib]
[26] J.L. Levant, M. Ramdani, R. Perdriau, "Solving Board-Level Issues with the ICEM Model", In EMC Compo 2005, 2005. [bib]
[27] R. Perdriau, M. Ramdani, J.L. Levant, "EMC Prediction in Microcontrollers using VHDL-AMS", In 1st International Conference on Embedded EMC (2EMC), 2005. [bib]
[28] R. Perdriau, M. Ramdani, J.L. Levant, A.M. Trullemans-Anckaert, "EMC Evaluation in Integrated Circuits Using VHDL-AMS", In IEEE International Symposium on Industrial Electronics (ISIE) 2004, 2004. [bib]
[29] A.M. Trullemans-Anckaert, R. Perdriau, M. Ramdani, J.L. Levant, "Early Prediction of Conducted-Mode Emission of Complex ICs", In Forum on Design Languages (FDL'04), 2004. [bib]
[30] M. Ramdani, J.L. Levant, R. Perdriau, "ICEM Model Extraction: a Case Study", In 2004 IEEE EMC Symposium, 2004. [bib]
[31] J.L. Levant, M. Ramdani, R. Perdriau, "Exploitation of the ICEM Model for Jitter Analysis in an Integrated PLL", In Design of Circuits and Integrated Systems (DCIS) 2004, 2004. [bib]
[32] R. Perdriau, M. Ramdani, J.L. Levant, "An IP-Based Chip-Level EMC Modeling and Prediction Methodology", In Design of Circuits and Integrated Systems (DCIS) 2004, 2004. [bib]
[33] J.L. Levant, M. Ramdani, R. Perdriau, "PLL Jitter Improvement Using the ICEM Model", In EMC Compo 2004, pp. 129-137, 2004. [bib]
[34] R. Perdriau, M. Ramdani, J.L. Levant, A. Meresse, A.M. Trullemans-Anckaert, "Reusable Activity Models for EMC Prediction in Integrated Circuits", In EMC Compo 2004, pp. 32-37, 2004. [bib]
[35] J.L. Levant, E. Tinlot, M. Ramdani, R. Perdriau, "Modélisation ICEM de l'activité en courant d'un microcontrôleur", In Telecom 2003 & JFMMA, pp. 176-179, 2003. [bib]
[36] E. Sicard, M. Ramdani, O. Maurice, R. Perdriau, "Towards an International Standard: ICEM model", In International Conference on Electromagnetic Near-Field Characterization (ICONIC), pp. 62-66, 2003. [bib]
[37] R. Perdriau, M. Ramdani, J.L. Levant, A.M. Trullemans-Anckaert, "Modélisation VHDL-AMS haut niveau de l'activité en courant des mémoires en vue de l'optimisation de la compatibilité électromagnétique", In FTFC'2003, pp. 167-171, 2003. [bib]
[38] M. Ramdani, J.L. Levant, R. Perdriau, "Convolution Example Applied to EMC in ICs", In IC-CAP International Workshop, 2002. [bib]
[39] R. Perdriau, A.M. Trullemans-Anckaert, M. Ramdani, "Modélisation VHDL-AMS haut niveau d'un système de transmission de puissance et de données par lien inductif", In FTFC'2001, pp. 145-153, 2001. [bib]
[40] R. Perdriau, P. Plainchault, "Réseaux de capteurs-actionneurs : la solution Ethernet-IP", In Colloque Interdisciplinaire en Instrumentation (C2I), 2000. [bib]
Conferences without Peer Review
[41] M. Ramdani, J.L. Levant, R. Perdriau, "Méthodes de mesure en émission et en susceptibilité pour les circuits intégrés", 2003. [bib]
[42] R. Perdriau, M. Ramdani, J.L. Levant, "Méthodologie de simulation VHDL-AMS pour l'extraction du courant dynamique d'un CI", 2003. [bib]
[43] R. Perdriau, B. Gorria, "Principes et enjeux de l'IP embarqué", 2002. [bib]
[44] R. Perdriau, "PPP/IP et Ethernet/IP embarqués", 2001. [bib]
[45] O. Beaudoux, R. Perdriau, P. Plainchault, "Digital Signal Processor and Neuron Chip: from Image and Audio Analysis to Motor Driving", 1996. [bib]
Posters, Tutorials, Invited Talks
[46] S. Baffreau, R. Perdriau, S.Y. Yuan, "Assessment of the Immunity of a Dual-Core 16-Bit Microcontroller to Near-Field Injection", EMC Compo 2009 (Poster), 2009. [bib]
[47] A. El Abbazi, M. Ramdani, M. Drissi, J.L. Levant, R. Perdriau, "Optimization of a New Septum Shape for a TEM Cell by 3D Electromagnetic Simulation", EMC Compo 2005 (Poster), 2005. [bib]
[48] M. Ramdani, R. Perdriau, S. Ben Dhia, J.L. Levant, "IC EMC Behavior Characterization and Prediction in the Design Process", IEEE International Conference on Industrial Technology (Tutorial), 2004. [bib]
[49] O. Maurice, R. Perdriau, "A Brief History of IC Immunity", EMC Compo 2004 (Tutorial), 2004. [bib]
[50] M. Ramdani, R. Perdriau, E. Sicard, "La CEM dans les circuits intégrés : modèles, outils et acteurs", GDR Ondes - CNRS Plenary Meeting (Poster), 2003. [bib]
[51] R. Perdriau, "Contribution to Mixed-Signal Design Methodologies using VHDL-AMS", IEEE International Symposium on Quality Electronic Design (Ph.D Student Forum), 2002. [bib]
[52] R. Perdriau, A. Sourice, "Handel-C : une autre approche de la conception de FPGA", Septièmes Journées Pédagogiques du CNFM (Poster), 2002. [bib]
[53] R. Perdriau, M. Ramdani, "VHDL-AMS : un complément fédérateur à l'enseignement de la microélectronique", Septièmes Journées Pédagogiques du CNFM (Poster), 2002. [bib]
Standards
[54] S. Baffreau, C. Huet, E. Lamoureux, C. Lochot, O. Maurice, R. Perdriau, M. Ramdani, E. Sicard, A. de la Villeguérin, "Basis for an Integrated Circuit Immunity Model (ICIM)", 2003. [bib]
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