Sjoerd
Sjoerd Op 't Land
Associate Professor
Experience
Researcher
IETR UMR 6164
Associate Professor
Groupe ESEO
  • General electronics
PhD Candidate
Groupe ESEO, INSA de Rennes
Master in Electronics
University of Twente, the Netherlands

MSc in Electrical Engineering from the University of Twente, the Netherlands, 2011

Publications

Journal articles

  1. Sjoerd Op 'T Land, Mohamed Ramdani, Richard Perdriau, M'Hamed Drissi, Frank Leferink Field-To-Long-Segmented-Trace Coupling with Arbitrary Loads and a Transparent Upper Bound Using a Single Modified Taylor Cell IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2016, 58 (5), pp.1517-1525. 〈10.1109/TEMC.2016.2566449〉
    @article{optland:hal-01377005,
      TITLE = {{Field-To-Long-Segmented-Trace Coupling with Arbitrary Loads and a Transparent Upper Bound Using a Single Modified Taylor Cell}},
      AUTHOR = {Op 't Land, Sjoerd and Ramdani, Mohamed and Perdriau, Richard and Drissi, M'Hamed and Leferink, Frank},
      URL = {https://hal.archives-ouvertes.fr/hal-01377005},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {58},
      NUMBER = {5},
      PAGES = {1517-1525},
      YEAR = {2016},
      DOI = {10.1109/TEMC.2016.2566449},
      KEYWORDS = {GTEM cell ; field-to-trace coupling ; modified Taylor model ; closed-form solution ; full-wave simulation},
      PDF = {https://hal.archives-ouvertes.fr/hal-01377005/file/OptLand-GeneralizedTaylor-local.pdf},
      HAL_ID = {hal-01377005},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    In modern electronic products, the printed circuit board (PCB) traces may well form the dominant coupling path in radiated immunity problems. Therefore, an understanding of the designable parameters that influence the worst-case induced voltages can be of use to the PCB designer, together with rapid simulations. Therefore, a modified single (unmeshed) Taylor cell is combined with transmission line theory to predict the terminal voltages induced by a grazing, vertically polarized plane wave, incident on a multi-segment trace with arbitrary terminal impedances. The resulting model is closed-form and therefore suitable for rapid simulations. Furthermore, the model is geometrically approximated to provide understanding on how designable PCB parameters determine the worst-case induced voltage. Finally, the model is compared to measurement results.
  2. Mohamed Amellal, Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Ali Ahaitouf, M'Hamed Drissi Design of a Wideband Multiplexer for Direct Power Injection on Non-DC Functional Signals IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2015, pp.603 - 606. 〈10.1109/TEMC.2015.2405089〉
    @article{amellal:hal-01161603,
      TITLE = {{Design of a Wideband Multiplexer for Direct Power Injection on Non-DC Functional Signals}},
      AUTHOR = {Amellal, Mohamed and Op 't Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Ahaitouf, Ali and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-01161603},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      PAGES = {603 - 606},
      YEAR = {2015},
      MONTH = Jun,
      DOI = {10.1109/TEMC.2015.2405089},
      HAL_ID = {hal-01161603},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  3. Sjoerd Op 'T Land, Mohamed Ramdani, Richard Perdriau, Yannis Braux, M'Hamed Drissi Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2014, 56 (4), pp.864-870. 〈10.1109/TEMC.2014.2313231〉
    @article{optland:hal-01087147,
      TITLE = {{Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling}},
      AUTHOR = {Op 't Land, Sjoerd and Ramdani, Mohamed and Perdriau, Richard and Braux, Yannis and Drissi, M'Hamed},
      URL = {https://hal.inria.fr/hal-01087147},
      JOURNAL = {{IEEE Transactions on Electromagnetic Compatibility}},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers}},
      VOLUME = {56},
      NUMBER = {4},
      PAGES = {864-870},
      YEAR = {2014},
      MONTH = Jun,
      DOI = {10.1109/TEMC.2014.2313231},
      KEYWORDS = {closed-form solution ; full-wave simulation ; GTEM cell ; field-to-trace coupling ; modified Taylor model},
      PDF = {https://hal.inria.fr/hal-01087147/file/OptLand-Meandered_trace_validation-vertical_corrections.pdf},
      HAL_ID = {hal-01087147},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    Predicting the immunity of electronic boards to radiated electromagnetic interference requires the computation of the coupling efficiency of an electromagnetic field to PCB traces. In the case of complex PCBs, full-wave electromagnetic solvers are convenient, yet at the expense of simulation time. Therefore, this paper introduces the extension of a modified Taylor-based analytical model to the case of traces terminated at one end by a non-characteristic impedance. This model makes it possible to determine the far-field-to-trace coupling using only a sum of closed-form equations. When applied to a shorted, meandered PCB trace, it was found to be as precise as 2.2 dB average absolute error with respect to GTEM measurements, which demonstrates its relevance for immunity prediction. Moreover, the full-wave simulation of this case study was validated using the extended model and found to be as precise as 1.4 dB average absolute error.
  4. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani Low-cost 0603 SMD Impedance Measurement Fixture Revue Méditerranéenne des Télécommunications, 2013, 3 (1), pp.81-84
    @article{optland:hal-00776510,
      TITLE = {{Low-cost 0603 SMD Impedance Measurement Fixture}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00776510},
      JOURNAL = {{Revue M{\'e}diterran{\'e}enne des T{\'e}l{\'e}communications}},
      VOLUME = {3},
      NUMBER = {1},
      PAGES = {81-84},
      YEAR = {2013},
      MONTH = Apr,
      PDF = {https://hal.archives-ouvertes.fr/hal-00776510/file/OptLand_SMD_fixture-local.pdf},
      HAL_ID = {hal-00776510},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    For microwave designs and when designing for electromagnetic compatibility (EMC), we need competent models of passive surface mount devices (SMDs), that is: resistors, capacitors and inductors. Such models are not always available or trustworthy, so we sometimes need to measure the impedance of these components ourselves. Appropriate measurement equipment exists, but often exceeds the available budget. In this paper, we design and build a low-cost test fixture that allows to measure the impedance of a 0603 SMD with a vector network analyser (VNA) or impedance analyser. Different fixture compensation methods are compared; a Short-Open-Load (SOL) calibration seems to be reliable up to about 12 GHz. The impedance precision depends on the used analyser.
  5. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Marco Leone, M'Hamed Drissi Simple, Taylor-based Worst-case Model for Field-to-line Coupling Progress In Electromagnetics Research, EMW Publishing, 2013, 140, pp.297-311. 〈10.2528/PIER13041207〉
    @article{optland:hal-00832250,
      TITLE = {{Simple, Taylor-based Worst-case Model for Field-to-line Coupling}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Leone, Marco and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00832250},
      JOURNAL = {{Progress In Electromagnetics Research}},
      PUBLISHER = {{EMW Publishing}},
      VOLUME = {140},
      PAGES = {297-311},
      YEAR = {2013},
      MONTH = Jun,
      DOI = {10.2528/PIER13041207},
      KEYWORDS = {field-to-line coupling ; Taylor ; analytical model ; worst case ; microstrip ; PCB ; long line},
      PDF = {https://hal.archives-ouvertes.fr/hal-00832250/file/Op_t_Land_-_Simple_Taylor-based_worst-case_model_for_field-to-line_coupling.pdf},
      HAL_ID = {hal-00832250},
      HAL_VERSION = {v2},
    }
     
    Abstract...
    To obtain Electromagnetic Compatibility (EMC), we would like to study the worst-case electromagnetic field-induced voltages at the ends of Printed Circuit Board (PCB) traces. With increasing frequencies, modelling these traces as electrically short no longer suffices. Accurate long line models exist, but are too complicated to easily induce the worst case. Therefore, we need a simple analytical model. In this article, we predict the terminal voltages of an electrically long, two-wire transmission line with characteristic loads in vacuum, excited by a linearly polarised plane wave. The model consists of a short line model (one Taylor cell) with an intuitive correction factor for long line effects: the modified Taylor cell. We then adapt the model to the case of a PCB trace above a ground plane, illuminated by a grazing, vertically polarised wave. For this case, we prove that end-fire illumination constitutes the worst case. We derive the worst-case envelope and try to falsify it by measurement in a Gigahertz Transverse Electromagnetic (GTEM) cell.

Conference papers

  1. M. Stojanovic, F. Lafont, Priscillia Fernandez-Lopez, Sjoerd Op 'T Land, Richard Perdriau Modified Kron's Method (MKME) for EMC optimization, applied to an EMC filter 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), May 2016, SHENZHEN, China. 01, pp.782-784, 2016, 〈10.1109/APEMC.2016.7522865〉
    @inproceedings{stojanovic:hal-01400120,
      TITLE = {{Modified Kron's Method (MKME) for EMC optimization, applied to an EMC filter}},
      AUTHOR = {Stojanovic, M. and Lafont, F. and Fernandez-Lopez, Priscillia and Op 't Land, Sjoerd and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01400120},
      BOOKTITLE = {{2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)}},
      ADDRESS = {SHENZHEN, China},
      VOLUME = {01},
      PAGES = {pp.782-784},
      YEAR = {2016},
      MONTH = May,
      DOI = {10.1109/APEMC.2016.7522865},
      KEYWORDS = {Radio frequency ; Electromagnetic Compatibility (EMC) ; electromagnetic compatibility ; power filters ; 3D simulation ; EMC filter ; EMC optimization ; LC filters ; MKME method ; PSpice techniques ; filter designers ; filter responses ; inter-component parasitic couplings ; modified Kron's method ; Capacitors ; LC circuits ; Modified Kron's Method for EMC (MKME)},
      HAL_ID = {hal-01400120},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    In filter design, inter-component parasitic couplings play a major role in the filter response. Most often, filter designers try to minimize these couplings through a proper implementation of components; conversely, this paper aims to optimize filter responses through a clever use of these couplings. Previous works have been performed to reach such an objective ([1]-[2]), focusing on the study of LC filters with 3D simulation or PSpice techniques. Moreover, the MKME method has been identified as a promising technique in many design cases. The objective of this paper is to introduce the application of the MKME method to an LC filter, to validate its use and benefits, before deploying it for more complex filter structures.
  2. A. Ayed, Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani FastImmunity: An EDA extension for PCB immunity prediction 7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016, May 2016, Shenzhen, China. Institute of Electrical and Electronics Engineers Inc., pp.207--210, 2016, 〈10.1109/APEMC.2016.7523011〉
    @inproceedings{ayed:hal-01368134,
      TITLE = {{FastImmunity: An EDA extension for PCB immunity prediction}},
      AUTHOR = {Ayed, A. and Op 't Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed},
      URL = {https://hal-univ-rennes1.archives-ouvertes.fr/hal-01368134},
      BOOKTITLE = {{7th Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2016}},
      ADDRESS = {Shenzhen, China},
      PUBLISHER = {{Institute of Electrical and Electronics Engineers Inc.}},
      PAGES = {207--210},
      YEAR = {2016},
      MONTH = May,
      DOI = {10.1109/APEMC.2016.7523011},
      KEYWORDS = { Radiated electromagnetic interferences ;  Printed circuit board (PCBs) ;  Electromagnetic fields ;  Electromagnetic pulse ;  Electronic design automation ;  Forecasting ;  Polychlorinated biphenyls ;  Printed circuits ;  Altium Designer ;  Design phase ;  EDA extension ;  PCB designers ;  Prediction model ;  Electromagnetic compatibility ;  Design ; Computer aided design ;  Printed circuit boards},
      HAL_ID = {hal-01368134},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Predicting the immunity of printed circuit boards (PCBs) to radiated electromagnetic interference (EMI) requires the computation of the electromagnetic field's coupling to PCB traces. A modified Taylor-based analytical model exists developed and validated for PCB's immunity prediction. In this paper, we present the methodology of development of an electronic design automation (EDA) extension for Altium Designer based on the prediction model. The developed extension allows PCB designers to have further insight on PCBs immunity during design phase and implements a unique electromagnetic compatibility (EMC) feature compared to existing EMC tools. © 2016 IEEE.
  3. Sjoerd Op 'T Land, Mohamed Ramdani L’immunité des circuits intégrés au-delà de 1 GHz Colloque International TELECOM'2015 & 9èmes JFMMA, May 2015, Meknès, Maroc
    @inproceedings{optland:hal-01169577,
      TITLE = {{L'immunit{\'e} des circuits int{\'e}gr{\'e}s au-del{\`a} de 1 GHz}},
      AUTHOR = {Op 't Land, Sjoerd and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-01169577},
      NOTE = {Keynote},
      BOOKTITLE = {{Colloque International TELECOM'2015 \& 9{\`e}mes JFMMA}},
      ADDRESS = {Mekn{\`e}s, Morocco},
      YEAR = {2015},
      MONTH = May,
      HAL_ID = {hal-01169577},
      HAL_VERSION = {v1},
    }
     
    Abstract...
  4. Sjoerd Op 'T Land, Olga Tereshchenko, Mohamed Ramdani, Frank Leferink, Richard Perdriau Printed Circuit Board Permittivity Measurement Using Waveguide and Resonator Rings EMC'14, May 2014, Tokyo, Japan
    @inproceedings{optland:hal-01169596,
      TITLE = {{Printed Circuit Board Permittivity Measurement Using Waveguide and Resonator Rings}},
      AUTHOR = {Op 't Land, Sjoerd and Tereshchenko, Olga and Ramdani, Mohamed and Leferink, Frank and Perdriau, Richard},
      URL = {https://hal.archives-ouvertes.fr/hal-01169596},
      BOOKTITLE = {{EMC'14}},
      ADDRESS = {Tokyo, Japan},
      YEAR = {2014},
      MONTH = May,
      KEYWORDS = {waveguide ; resonator ring ; PCB ; FR4 ; substrate ; permittivity ; material characterisation ; microstrip},
      PDF = {https://hal.archives-ouvertes.fr/hal-01169596/file/OptLandTereshchenko_FR4_Permittivity-local.pdf},
      HAL_ID = {hal-01169596},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Knowing the frequency dependent complex permittivity of Printed Circuit Board (PCB) substrates is important in modern electronics. In this paper, two methods for measuring the permittivity are applied to the same Flame Resistant (FR4) substrate and the results are compared. The reference measurement is performed by inserting the sample in a rectangular waveguide and measuring the scattering parameters. The other measurement is performed by etching a microstrip ring resonator on the same substrate and measuring the scattering parameters. The results are similar and suggest isotropy and homogeneity.
  5. Sjoerd Op 'T Land, Tvrtko Mandić, Mohamed Ramdani, Adrijan Barić, Richard Perdriau, Bart Nauwelaers Comparison of Field-To-Line Coupling Models: Coupled Transmission Lines Model versus Single-cell Corrected Taylor Model Electromagnetic Compatibility (EMC EUROPE 2013), The 2013 International Symposium on, Sep 2013, Brugge, Belgium. pp.276-281, 2013
    @inproceedings{optland:hal-00923674,
      TITLE = {{Comparison of Field-To-Line Coupling Models: Coupled Transmission Lines Model versus Single-cell Corrected Taylor Model}},
      AUTHOR = {Op 'T Land, Sjoerd and Mandi{\'c}, Tvrtko and Ramdani, Mohamed and Bari{\'c}, Adrijan and Perdriau, Richard and Nauwelaers, Bart},
      URL = {https://hal.archives-ouvertes.fr/hal-00923674},
      BOOKTITLE = {{Electromagnetic Compatibility (EMC EUROPE 2013), The 2013 International Symposium on}},
      ADDRESS = {Brugge, Belgium},
      PAGES = {276-281},
      YEAR = {2013},
      MONTH = Sep,
      KEYWORDS = {EMC ; immunity ; field-to-line coupling ; microstrip ; PCB ; TEM cell ; GTEM cell},
      PDF = {https://hal.archives-ouvertes.fr/hal-00923674/file/OptLandMandic-Field_to_line_final_v3-local.pdf},
      HAL_ID = {hal-00923674},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Models for field-to-line coupling are interesting be- cause they help to predict the immunity of PCBs and explain the relation between routing and immunity. In this article a meandered PCB trace illuminated by EM field in a TEM cell is analysed. The near-end and far-end coupling is predicted using two models: a detailed and an approximative one. The detailed model is a circuit of coupled multi-conductor transmission lines evaluated with a circuit simulator. The approximative model consists of a single Taylor cell with an analytical modification evaluated using a numerical computing tool. Both predictions are compared with measurements and turn out to be equally precise. The advantage of the coupled lines model is its flexibility, the advantage of the modified Taylor model is its ease of use.
  6. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Olivier Maurice, M'Hamed Drissi Kron Simulation of Field-to-line Coupling Using a Meshed and a Modified Taylor Cell Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), The 9th International Workshop on, Dec 2013, Nara, Japan. pp.1-6, 2012
    @inproceedings{optland:hal-00923660,
      TITLE = {{Kron Simulation of Field-to-line Coupling Using a Meshed and a Modified Taylor Cell}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Maurice, Olivier and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00923660},
      BOOKTITLE = {{Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), The 9th International Workshop on}},
      ADDRESS = {Nara, Japan},
      PAGES = {1-6},
      YEAR = {2013},
      MONTH = Dec,
      KEYWORDS = {PCB ; EMC ; field-to-line coupling ; immunity ; microstrip ; Kron ; frequency-adaptive meshing ; modified Taylor},
      PDF = {https://hal.archives-ouvertes.fr/hal-00923660/file/OptLandTaylorKron-local.pdf},
      HAL_ID = {hal-00923660},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Printed Circuit Board (PCB) traces play a role in the immunity of electronic products. Contrary to Integrated Circuits (ICs), the layout of PCB traces can be changed rather late in a product's design. Therefore, it is interesting to equip the PCB designer with simple tools that predict the immunity of his PCB traces. In this article, we compare two simulations of field-to-long line coupling based on Taylor's model. Firstly, the line is meshed into electrically short Taylor cells and numerically simulated using Kron's method. Secondly, we use one modified Taylor cell, which does not need meshing and is a closed-form, analytical result. The two simulations turn out to be equally precise on a straight microstrip line, the meshed simulation being more flexible, the simulation using a modified Taylor cell being faster.
  7. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Ignacio Gil, Frédéric Lafon, M'Hamed Drissi Design of a 20 GHz DPI method for SOIC8 Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on, Sep 2012, Rome, Italy. pp.1-6, 2012, 〈10.1109/EMCEurope.2012.6396691〉
    @inproceedings{optland:hal-00776483,
      TITLE = {{Design of a 20 GHz DPI method for SOIC8}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Gil, Ignacio and Lafon, Fr{\'e}d{\'e}ric and Drissi, M'Hamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00776483},
      BOOKTITLE = {{Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on}},
      ADDRESS = {Rome, Italy},
      PAGES = {1-6},
      YEAR = {2012},
      MONTH = Sep,
      DOI = {10.1109/EMCEurope.2012.6396691},
      KEYWORDS = {DPI ; EMC ; GHz ; calibration ; centrimetre ; crosstalk ; immunity ; integrated circuit ; loss ; low-cost ; modelling},
      PDF = {https://hal.archives-ouvertes.fr/hal-00776483/file/OptLand_Centimetre_DPI-local.pdf},
      HAL_ID = {hal-00776483},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to determine the power Ptrans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk.
  8. Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Frédéric Lafon Towards nonlinearity measurement and simulation using common EMC equipment Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on, Nov 2011, Dubrovnik, Croatia. pp.125-130, 2011
    @inproceedings{optland:hal-00776498,
      TITLE = {{Towards nonlinearity measurement and simulation using common EMC equipment}},
      AUTHOR = {Op 'T Land, Sjoerd and Perdriau, Richard and Ramdani, Mohamed and Lafon, Fr{\'e}d{\'e}ric},
      URL = {https://hal.archives-ouvertes.fr/hal-00776498},
      BOOKTITLE = {{Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on}},
      ADDRESS = {Dubrovnik, Croatia},
      PAGES = {125-130},
      YEAR = {2011},
      MONTH = Nov,
      KEYWORDS = {modeling ; linearity hypothesis ; immunity ; integrated circuit ; DPI ; ICIM-CI ; X-parameters},
      PDF = {https://hal.archives-ouvertes.fr/hal-00776498/file/OptLand-Towards_Nonlinearity_Measurement_and_Simulation_Using_Common_EMC_Equipment-local.pdf},
      HAL_ID = {hal-00776498},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Integrated circuit (IC) models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). The integrated circuit immunity model for conducted immunity (ICIM-CI) of IEC 62433-4 assumes that the IC terminals still behave linearly at injection power levels that cause susceptibility. This hypothesis should be systematically verified when modelling integrated circuits for EMC, but this is not always straightforward. A simple measurement set-up using a directional coupler and a spectrum analyser is demonstrated to verify this linearity hypothesis using commonly available equipment. The measured reflected spectrum can be transformed into the |X11| parameter, which is the non-linear extension of the S11 parameter. X-parameters may be the key to predict susceptibility by simulation when the linearity hypothesis is invalid.
  9. Sjoerd Op 'T Land, Frédéric Lafon, François De Daran, Frank Leferink, M'Hamed Drissi, Mohamed Ramdani Immunity Modeling of the LM2902 Operational Amplifier EMC Europe 2010, 9th International Symposium on EMC and 20th International Wroclaw Symposium on Electromagnetic Compatibility, Sep 2010, Wroclaw, Poland. pp.1-4, 2010
    @inproceedings{optland:hal-00776523,
      TITLE = {{Immunity Modeling of the LM2902 Operational Amplifier}},
      AUTHOR = {Op 'T Land, Sjoerd and Lafon, Fr{\'e}d{\'e}ric and De Daran, Fran{\c c}ois and Leferink, Frank and Drissi, M'Hamed and Ramdani, Mohamed},
      URL = {https://hal.archives-ouvertes.fr/hal-00776523},
      BOOKTITLE = {{EMC Europe 2010, 9th International Symposium on EMC and 20th International Wroclaw Symposium on Electromagnetic Compatibility}},
      ADDRESS = {Wroclaw, Poland},
      PAGES = {1-4},
      YEAR = {2010},
      MONTH = Sep,
      KEYWORDS = {operational amplifier ; differential connection ; modeling ; DPI ; ICIM ; immunity ; integrated circuit},
      PDF = {https://hal.archives-ouvertes.fr/hal-00776523/file/OptLand_Immunity_Modeling_of_the_LM2902_Operational_Amplifier.pdf},
      HAL_ID = {hal-00776523},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Component models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). A method to extract these models using measurements on integrated circuits (ICs) already exists. This measurement method for ICs with single-ended connections is extended, to include ICs with differential connections. The LM2902 op-amp is measured and modeled as a first case study.

Theses

  1. Sjoerd Op 'T Land Integrated circuit immunity modelling beyond 1 GHz Electromagnetism. INSA de Rennes, 2014. English. 〈NNT : 2014ISAR0029〉
    @phdthesis{optland:tel-01165061,
      TITLE = {{Integrated circuit immunity modelling beyond 1 GHz}},
      AUTHOR = {Op 't Land, Sjoerd},
      URL = {https://tel.archives-ouvertes.fr/tel-01165061},
      NUMBER = {2014ISAR0029},
      SCHOOL = {{INSA de Rennes}},
      YEAR = {2014},
      MONTH = Jun,
      KEYWORDS = {Integrated circuits ; Electromagnetic compatibility ; Field-to-trace coupling ; Modeling ; Taylor cell ; Immunity ; EMC ; CEM ; Immunit{\'e} ; Cellule de Taylor ; Mod{\'e}lisation ; Couplage champ-{\`a}-piste ; DPI ; ICIM-CI},
      TYPE = {Theses},
      PDF = {https://tel.archives-ouvertes.fr/tel-01165061/file/These_OPTLAND_Confidentielle2.pdf},
      HAL_ID = {tel-01165061},
      HAL_VERSION = {v1},
    }
     
    Abstract...
    Electromagnetic Compatibility (EMC) is the faculty of working devices to co-exist electromagnetically. In practice, it turns out to be very complex to create electromagnetically compatible devices. The weapon to succeed the complex challenge of creating First-Time-Right (FTR) compatible devices is modelling. This thesis investigates whether it makes sense to model the conducted immunity of Integrated Circuits (ICs) beyond 1 GHz and how to do that. If the Printed Circuit Board (PCB) traces determine a PCB's radiated immunity, it is interesting to predict their coupling efficiency and to understand how that depends on the trace routing. Because full-wave solvers are slow and do not yield understanding, the existing Taylor cell model is modified to yield another 100 times speedup and an insightful upper bound, for vertically polarised, grazing-incident plane wave illumination of electrically long, multi-segment traces with arbitrary terminal loads. The results up to 20 GHz match with full-wave simulations to within 2.6 dB average absolute error and with Gigahertz Transverse Electromagnetic-cell (GTEM-cell) measurements to within 4.0 dB average absolute error. If the conducted immunity of ICs is interesting above 1 GHz, a measurement method is needed that is valid beyond 1 GHz. There is no standardised method yet, because with rising frequency, the common measurement set-up increasingly obscures the IC's immunity. An attempt to model and remove the set-up's impact on the measurement result proved difficult. Therefore, a simplified set-up and extraction method is proposed and a proof-of-concept of the automatic generation of the set-up's PCB is given. The conducted immunity of an LM7805 voltage regulator is measured up to 4.2 GHz to demonstrate the method. Except for a general trend of rising frequencies, there is only little concrete proof for the relevance of IC immunity modelling beyond 1 GHz. A full-wave simulation suggests that up to 10 GHz, most energy enters the die via the trace. Similarly, the radiated immunity of a microstrip trace and an LM7805 voltage regulator is predicted by concatenating the models developed above. Although this model neglects the radiated immunity of the IC itself, the prediction corresponds with GTEM-cell measurement to within 2.1 dB average absolute error. These experiments suggest the most radiation enters a PCB via its traces, well beyond 1 GHz, hence it is useful to model the conducted immunity of IC beyond 1 GHz. Therefore, the extension of IEC 62132-4 to 10 GHz should be seriously considered. Moreover, the speed and transparency of the modified Taylor model for field-to-trace coupling open up new possibilities for computer-aided design. The semi-automatic generation of lean extraction PCB could facilitate model extraction. There are also critical remaining questions, remaining to be answered.