Detection of Electromagnetic Interference in Microcontrollers using the Instability of an Embedded Phase-Lock Loop

by S.Y. Yuan, Y.L. Wu, R. Perdriau, S.S. Liao
Reference:
S.Y. Yuan, Y.L. Wu, R. Perdriau, S.S. Liao, “Detection of Electromagnetic Interference in Microcontrollers using the Instability of an Embedded Phase-Lock Loop”, In IEEE Transactions on Electromagnetic Compatibility, vol. TBD, pp. TBD, 2013.
Bibtex Entry:
@article{temc13,
	Author = {Yuan, S.Y. and Wu, Y.L. and Perdriau, R. and Liao, S.S.},
	Journal = {IEEE Transactions on Electromagnetic Compatibility},
	Pages = {TBD},
	Title = {{Detection of Electromagnetic Interference in Microcontrollers using the Instability of an Embedded Phase-Lock Loop}},
	Volume = {TBD},
	Year = {2013}}